A New Method of Preparing Tilt Boundaries for High Resolution Electron Microscopy

1987 ◽  
Vol 115 ◽  
Author(s):  
William Krakow ◽  
Victor Castańo
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
High Resolution ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Zone Axis ◽  
New Method ◽  
Lateral Overgrowth ◽  
Resolution Electron ◽  
Tilt Boundaries

ABSTRACTA new method of preparing bicrystal substrates of NaCl with a common tilt zone axis has been developed. Upon a lateral overgrowth of NaCl, bridging the two mechanically polished and oriented crystals, very thin films can then be vapor deposited. Au bicrystals of ∼ 75Å thickness and b.c.c. Cr films of similar thickness with grain boundaries have been fabricated.

High-resolution electron microscopy of nanostructured materials

1995 ◽  
Vol 53 ◽  
pp. 172-173
Author(s):  
M. José-Yacamán
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
Nanostructured Materials ◽  
High Resolution Electron Microscopy ◽  
Hrem Image ◽  
Small Particles ◽  
Resolution Electron ◽  
Nanophase Materials

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.

scholarly journals Analysis of Stresses and Strains around Dislocations at Grain Boundaries by Quantitative High-Resolution Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 894-895
Author(s):  
M Hytch ◽  
J-L Putaux ◽  
J Thibault
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

A Study of Microstructures of Grain Boundaries in Sintered Fe77Nd15B8Permanent Magnet by High-Resolution Electron Microscopy

1985 ◽  
Vol 24 (Part 1, No. 7) ◽  
pp. 896-897 ◽  
Author(s):  
Kenji Hiraga ◽  
Makoto Hirabayashi ◽  
Masato Sagawa ◽  
Yutaka Matsuura
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron
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