Analysis of Domain-Size Distributions in Epitaxial Growth Using Leed Angular Profiles
Keyword(s):
AbstractAngular profiles of diffracted beams in surface-sensitive diffraction techniques can be used to establish the degree of order at the surface of crystals. Results are presented showing the sensitivity of such profiles to the growth mode of overlayer islands. A method is presented to incorporate the two-dimensional nature of the problem into the analysis and to extract finite-size effects from fundamental and superlattice beams.
1994 ◽
Vol 76
(5-6)
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pp. 1129-1151
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1995 ◽
Vol 214
(3)
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pp. 445-451
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1986 ◽
Vol 19
(8)
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pp. 1429-1438
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1999 ◽
Vol 32
(26)
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pp. 4897-4906
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2004 ◽
Vol 16
(6)
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pp. 891-902
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