Fully Atomistic Analysis of Diffuse X-Ray Scattering Spectra of Silicon Defects
Keyword(s):
X Ray
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ABSTRACTDiffuse X-ray scattering is a useful method for studying defects in silicon and metals. Although the traditional approaches of analyzing experimental diffuse X-ray scattering data have given much information about the size of defects and defect clusters, they are not very well suited for determining the atomic configuration. We present a fully atomistic computational method to calculate the diffuse X-ray scattering line profile of an arbitrary atomic configuration, and compare line profiles of point defects and Frenkel pair configurations with experiment.
1995 ◽
BioXTAS RAW: a free open-source program for small-angle X-ray scattering data reduction and analysis
2018 ◽
Vol 74
(a1)
◽
pp. a219-a219
Keyword(s):
X Ray
◽
2010 ◽
Vol 163
(1-2)
◽
pp. 1-12
◽
Lipid Bilayer Structure Determined by the Simultaneous Analysis of Neutron and X-Ray Scattering Data
2008 ◽
Vol 95
(5)
◽
pp. 2356-2367
◽
Keyword(s):
X Ray
◽