Fluctuations of Step Edges: Revelations About Atomic Processes Underlying Surface Mass Transport

1998 ◽  
Vol 528 ◽  
Author(s):  
T. L. Einstein ◽  
S. V. Khare ◽  
O. Pierre-Louis

AbstractExperimental advances in recent years make possible quantitative observations of step-edge fluctuations. By applying a capillary-wave analysis to these fluctuations, one can extract characteristic times, from which one learns about the mass-transport mechanisms that underlie the motion as well as the associated kinetic coefficients [1-3]. The latter do not require a priori insight about the microscopic energy barriers and can be applied to situations away from equilibrium. We have studied a large number of limiting cases and, by means of a unified formalism, the crossover between many of these cases[4]. Monte Carlo simulations have been used to corroborate these ideas. We have considered both isolated steps and vicinal surfaces; illustrations will be drawn from noble-metal systems, though semiconductors have also been studied. Attachment asymmetries associated with Ehrlich-Schwoebel barriers play a role in this behavior. We have adapted the formalism for nearly straight steps to nearly circular steps in order to describe the Brownian motion of single-layer clusters of adatoms or vacancies on metal surfaces, again in concert with active experimental activity [3,5]. We are investigating the role of external influences, particularly electromigration, on the fluctuations.

2002 ◽  
Vol 65 (12) ◽  
Author(s):  
T. Schwarz-Selinger ◽  
Y. L. Foo ◽  
David G. Cahill ◽  
J. E. Greene

2005 ◽  
Vol 407 (3-4) ◽  
pp. 239-255 ◽  
Author(s):  
Ivone Jiménez-Munt ◽  
Daniel Garcia-Castellanos ◽  
Manel Fernandez

2019 ◽  
Vol 55 (85) ◽  
pp. 12801-12804 ◽  
Author(s):  
Cheng Du ◽  
Yijing Gao ◽  
Jianguo Wang ◽  
Wei Chen

By controlling Cu nanoparticle layer thickness, the faradaic efficiency of the NRR can be enhanced to 59% in a Zn–N2 aqueous battery.


1986 ◽  
Vol 21 (2) ◽  
pp. 419-423 ◽  
Author(s):  
A. R. Gaddipati ◽  
William D. Scott

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