Determine the Three-Dimensional Crystallographic Misorientation in Heterostructures by Selected Area Diffraction (SAD) in TEM
Keyword(s):
ABSTRACTWe proposed a concise and novel scheme to determine the crystallographic misorientation of heteroepitaxial structures. In addition to subtle high-resolution transmission electron microscope images, the information revealed from selected-area diffraction patterns at the interfaces offers another path to determine the angles of misorientations. The principle is to extract the basically three-dimensional misorientation information from a two-dimensional selected-area diffraction pattern through the employment of the Laue circle
1988 ◽
Vol 44
(6)
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pp. 975-986
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2009 ◽
Vol 113
(41)
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pp. 17751-17754
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1997 ◽
Vol 38
(5)
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pp. 393-400
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