Deuteron Magnetic Resonance in a-Si and a-SiGe Produced from Fluorides
Keyword(s):
ABSTRACTDeuteron magnetic resonance line shapes and spin lattice relaxation times are presented for a-Si:D, F and a-SiGe:D, F. These parameters differ from those for typical a-Si:D, H samples, but in some respects are similar to those for an annealed a-Si:D, H sample. The a-SiGe:D, F spectra display an unusually large broad central weakly bound D resonance component and a barely-resolved Ge-D quadrupolar doublet. Comparisons indicate substantial differences in void morphology between the a-Si:D, F and a-SiGe:D, F.
1954 ◽
Vol 222
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pp. 526-541
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1986 ◽
Vol 24
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pp. 872-874
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1975 ◽
Vol 97
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pp. 3573-3578
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1972 ◽
Vol 69
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pp. 1804-1808
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1973 ◽
pp. 893-894
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1974 ◽
Vol 78
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pp. 1971-1977
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