Dependence of the Second-order G'-band Profile on the Electronic Structure of Single-wal Nanotubes

2001 ◽  
Vol 706 ◽  
Author(s):  
A. G. Souza Filho ◽  
A. Joribo ◽  
G. Dresselhaus ◽  
M. S. Dresselhaus ◽  
A. K. Swan ◽  
...  

AbstractWe analyze the dependence of the second-order G'-band profile in terms of their (n,m) indices by measuring the resonance Raman spectra of several semiconducting and metalic isolated single wal carbon nanotubes. We show that this profile is very sensitive to the electronic structure, thus making it possible to get structural (n,m) information and to probe the splitting of the van Hove singularities in the electronic density of states due to the trigona warping effect.

2010 ◽  
Vol 114 (6) ◽  
pp. 2505-2511 ◽  
Author(s):  
Martin Kalbac ◽  
Viktor Zólyomi ◽  
Ádám Rusznyák ◽  
János Koltai ◽  
Jenő Kürti ◽  
...  

2004 ◽  
Vol 858 ◽  
Author(s):  
Zhengtang Luo ◽  
Rongfu Li ◽  
Sang Nyon Kim ◽  
Fotios Papadimitrakopoulos

ABSTRACTThe radial breathing mode (RBM) region of the resonance Raman spectra of HiPco single walled carbon nanotubes (SWNTs) was investigated as a function of aggregation. This was modeled using an energetic deviation term (ΔE), imparted to the optical transitions (Eii(n, m)) by bundling effect. Eii(n, m) values obtained from photoluminescence (PL) measurements were used to reconstruct these RBM profiles. The simulation revealed that the PL-determined Eii(n, m) set provided a good fit in terms of peak position. Providing an accurate set of Eii(n, m) values becomes available, the RBM profile reconstruction methodology discussed herein could greatly enhance our ability to model a range of physicochemical changes to the immediate environment of SWNTs.


1983 ◽  
Vol 105 (3) ◽  
pp. 336-339 ◽  
Author(s):  
Soonhee Kim ◽  
Elizabeth S. Otterbein ◽  
Richard P. Rava ◽  
Stephan S. Isied ◽  
Joseph San Filippo

Carbon ◽  
2017 ◽  
Vol 117 ◽  
pp. 41-45 ◽  
Author(s):  
Luciano G. Moura ◽  
Marcus V.O. Moutinho ◽  
Pedro Venezuela ◽  
Francesco Mauri ◽  
Ariete Righi ◽  
...  

2006 ◽  
Vol 45 (No. 22) ◽  
pp. L578-L581 ◽  
Author(s):  
Ryo Tomuro ◽  
Takanori Matsumoto ◽  
Masahito Sano

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