Tomographic Imaging of Nanocrystals by Aberration-Corrected Scanning Transmission Electron Microscopy
Keyword(s):
ABSTRACTIn aberration corrected scanning transmission electron microscopy, the depth of focus is of the order of a few nanometers, so that the three-dimensional shape of nanocrystals could so far not be determined with atomic resolution. Here we show that with the assistance of image simulations it is possible to achieve atomic-scale information in the depth direction by analyzing a through-focal series where the number of atoms in most columns can be determined by Z-contrast simulations. The error in this analysis is about two atoms in the thickest regions, and less in thinner regions.
2012 ◽
Vol 18
(3)
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pp. 621-627
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2011 ◽
Vol 65
(8)
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pp. 656-659
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2011 ◽
Vol 174
(3)
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pp. 552-562
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2010 ◽
Vol 16
(S2)
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pp. 848-849
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