Performance Evaluation of VSI Attribute Control Chart for On-line Process Control

2013 ◽  
Vol 27 (4) ◽  
pp. 151-185
Author(s):  
Hong-Seok Bae
Keyword(s):  
Performance Evaluation ◽  
Process Control ◽  
Control Chart ◽  
On Line ◽  
Line Process

Diagnostic errors and repetitive sequential classifications in on-line process control by attributes

2010 ◽  
Vol 201 (1) ◽  
pp. 231-238 ◽  
Author(s):  
Roberto da Costa Quinino ◽  
Emerson C. Colin ◽  
Linda Lee Ho
Keyword(s):  
Process Control ◽  
Diagnostic Errors ◽  
On Line ◽  
Line Process

On-Line Process Control using Attributes with Misclassification Errors: An Economical Design for Short-Run Production

2012 ◽  
Vol 41 (10) ◽  
pp. 1813-1832 ◽  
Author(s):  
Lupércio F. Bessegato ◽  
Roberto C. Quinino ◽  
Luiz H. Duczmal ◽  
Linda Lee Ho
Keyword(s):  
Process Control ◽  
Economical Design ◽  
Misclassification Errors ◽  
Short Run ◽  
On Line ◽  
Line Process

On-Line Process Control Compositional Analysis of Aluminum Films Containing a Low Percentage of Copper

1971 ◽  
Vol 15 ◽  
pp. 539-547
Author(s):  
G. H. Glade ◽  
J. M. Matthews ◽  
F. R. Titcomb
Keyword(s):  
Process Control ◽  
Interconnection Networks ◽  
Semiconductor Device ◽  
Compositional Analysis ◽  
Aluminum Film ◽  
Portable Instrument ◽  
Aluminum Films ◽  
On Line ◽  
Line Process ◽  
Control Application

Aluminum film conducting stripes are widely used for semiconductor device interconnection networks. The addition of a low percentage of copper significantly increases their life. Composition must be controlled to maintain product quality.The paper discusses various methods used to analyze the copper composition in the aluminum films, and adaptation of one of these methods for process control application. A portable instrument designed for field use was adapted for use as an on-line instrument.

Measurement System Analysis Combined with Shewhart’s Approach

2015 ◽  
Vol 637 ◽  
pp. 7-11 ◽  
Author(s):  
Magdalena Diering ◽  
Adam Hamrol ◽  
Agnieszka Kujawińska
Keyword(s):  
Process Control ◽  
Control Chart ◽  
Measurement System ◽  
Manufacturing Process ◽  
Control Charts ◽  
System Analysis ◽  
Standard Procedure ◽  
Reference Value ◽  
Measurement Systems ◽  
On Line

The paper presents new procedure of methodology for statistical assessment of measurement systems variation (methodology known in the literature as Measurement Systems Analysis, MSA). This procedure allows for calculation and monitoring in real time (that is on-line) of measurement system (MS) characteristics which determine its usability for manufacturing process control. The presented solution pointed out the gap in process control, which consists in lack of methods for monitoring measurement processes in the on-line way. Their key point consists of taking samples that are also needed for the process control chart for the needs of the MSA method. This means that the samples are taken directly from the production line and during the production process. The method is combined with the standard procedure of statistical process control (SPC) with the use of process control charts. It is based on two control charts. The first one is called AD-chart (Average Difference chart) and it allows to estimate the variation between the operators and stability of the monitored measurement system. The second control chart illustrates the %R&R index (Repeatability and Reproducibility) and allows to monitor the MS capability.The paper also presents authors’ proposal of guidelines about the reference value for the %R&R index calculation and assessment. Recommendations and guidelines for choosing the reference value are based on two criteria: information about sample and manufacturing process variation and the purpose of using MS (product or process control).

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