Advances in X-Ray Analysis
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45

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7

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Published By Springer US

9781461399711, 9781461399698

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Flame Technique for High Temperature Single Crystal Weissenberg Photography (1000–3000°C)

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_45 ◽

1972 ◽

pp. 548-555 ◽

Cited By ~ 3

Author(s):

M. A. Viswamitra ◽

K. Jayalakshmi

Keyword(s):

High Temperature ◽

Single Crystal

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On-Line Process Control Compositional Analysis of Aluminum Films Containing a Low Percentage of Copper

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_44 ◽

1972 ◽

pp. 539-547

Author(s):

G. H. Glade ◽

J. M. Matthews ◽

F. R. Titcomb

Keyword(s):

Process Control ◽

Compositional Analysis ◽

Aluminum Films ◽

On Line ◽

Line Process

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Cross Linking of Collagen by Hydrophobe Bonds

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_42 ◽

1972 ◽

pp. 527-533 ◽

Cited By ~ 1

Author(s):

Edwin H. Shaw

Keyword(s):

Cross Linking

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Computer-Controlled X-Ray and Neutron Diffraction Experiments

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_4 ◽

1972 ◽

pp. 70-89 ◽

Cited By ~ 1

Author(s):

Melvin H. Mueller

Keyword(s):

Neutron Diffraction ◽

X Ray ◽

Computer Controlled

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Simultaneous Spiral Recording of Pole Figures on Polaroid Film for Texture Goniometers

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_39 ◽

1972 ◽

pp. 499-503

Author(s):

H. Ebel ◽

M. F. Ebel

Keyword(s):

Pole Figures

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The Measurement of Surface-Layer Stresses in a Polycrystalline Glass by Means of X-Ray Diffraction

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_37 ◽

1972 ◽

pp. 483-488

Author(s):

E. W. Kammer ◽

C. L. Vold

Keyword(s):

Surface Layer ◽

X Ray Diffraction ◽

X Ray

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Detector Background and Sensitivity of Semiconductor X-Ray Fluorescence Spectrometers

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_36 ◽

1972 ◽

pp. 470-482 ◽

Cited By ~ 21

Author(s):

F. S. Goulding ◽

J. M. Jaklevic ◽

B. V. Jarrett ◽

D. A. Landis

Keyword(s):

X Ray

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An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_33 ◽

1972 ◽

pp. 435-445 ◽

Cited By ~ 2

Author(s):

Robert E. Green

Keyword(s):

Grain Boundary ◽

Boundary Migration ◽

Grain Boundary Migration ◽

X Ray Diffraction ◽

X Ray

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Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_29 ◽

1972 ◽

pp. 373-387 ◽

Cited By ~ 19

Author(s):

T. B. Johansson ◽

R. Akselsson ◽

S. A. E. Johansson

Keyword(s):

Trace Analysis ◽

Emission Spectroscopy ◽

X Ray

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Fluorescence Analysis Using an Si (Li) X-Ray Energy Analysis System with Low-Power X-Ray Tubes and Radioisotopes

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9969-8_16 ◽

1972 ◽

pp. 228-239 ◽

Cited By ~ 7

Author(s):

G. R. Dyer ◽

D. A. Gedcke ◽

T. R. Harris

Keyword(s):

Low Power ◽

Energy Analysis ◽

Fluorescence Analysis ◽

X Ray ◽

Analysis System

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