Evaluation of Edge Electron Temperature Fluctuation by the Use of Fast Voltage Scanning Method on TST-2
2011 ◽
Vol 6
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pp. 2402036-2402036
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1997 ◽
Vol 68
(1)
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pp. 484-487
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2019 ◽
Vol 149
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pp. 111336
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1992 ◽
Vol 63
(10)
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pp. 4633-4635
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2020 ◽
Vol 768
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pp. 042020
2001 ◽
Vol 41
(5)
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pp. 449-454
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