MATERIAL PROPERTIES ANALYSIS OF CIRCUIT SUBASSEMBLIES: QUANTITATIVE CHARACTERIZATION OF SAPPHIRE (alpha-Al203) AND SILICON NITRIDE (Si3N4) USING CRYOGENIC CYCLING
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2016 ◽
Vol 49
(2)
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pp. 145-153
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1991 ◽
Vol 266
(10)
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pp. 6342-6352
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