Extended quantitative characterization of solar cell from calibrated voltage-dependent electroluminescence imaging

2021 ◽  
Vol 129 (4) ◽  
pp. 043106
Author(s):  
Daniel Ory ◽  
Nicolas Paul ◽  
Laurent Lombez
2016 ◽  
Vol 34 (4) ◽  
pp. 845-850 ◽  
Author(s):  
Adam Szyszka ◽  
Michał Obłąk ◽  
Tomasz Szymański ◽  
Mateusz Wośko ◽  
Wojciech Dawidowski ◽  
...  

AbstractThe applicability of scanning capacitance microscopy (SCM) technique for chosen electrical properties characterization of AIIIBV structures fabricated by Metalorganic Vapor Phase Epitaxy (MOVPE) was examined. The calibration curves for quantitative characterization of doping levels in GaAs layers were created. The AlGaN/GaN/Si heterostructures for high electron mobility transistor fabrication and InGaAs tunnel junction for tandem solar cell characterization were presented. The crucial factors of measurement conditions which could influence the obtained results were also discussed.


2017 ◽  
Vol 5 (12) ◽  
pp. 5709-5718 ◽  
Author(s):  
Mikas Remeika ◽  
Sonia Ruiz Raga ◽  
Shijin Zhang ◽  
Yabing Qi

Viability of ultrasonic spray coating as a pathway to scaling-up of perovskite solar cell production is improved by quantitative characterization of process conditions.


2019 ◽  
Vol 302 ◽  
pp. 71-77 ◽  
Author(s):  
Jae Kyeong Han ◽  
Min Eui Lee ◽  
Hyoung Jin Choi ◽  
Hyoung-Joon Jin ◽  
Young Soo Yun

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