Indentation Response and Contact Damage of Hard T-B-N Films Deposited by Magnetron Sputtering
2010 ◽
Vol 13
(1-2)
◽
pp. 81
◽
Keyword(s):
<p>Titanium-boron-nitride (Ti-B-N) films were deposited by reactive magnetron sputtering using a single TiB<sub>2</sub> target. The films were deposited under different Ar:N<sub>2</sub> ratios. The instrumented indentation technique (nanoindentation), is used to evaluate the mechanical properties of the films. A methodology is presented to evaluate the critical load to failure directly from the load depth curves. Significant effect of Ar:N<sub>2</sub> ratio was observed on the mechanical properties of the Ti-B-N films.</p>
2011 ◽
Vol 205
(19)
◽
pp. 4471-4479
◽
1992 ◽
pp. 324-328
2012 ◽
Vol 36
(5)
◽
pp. 529-535
◽
2019 ◽
Vol 7
(1)
◽
pp. 49-57
Keyword(s):