In-Situ Measurement Via E/M Impedance Spectroscopy Technique Using Shear Horizontal Piezoelectric Wafer Active Sensors
2015 ◽
Vol 1
(2)
◽
pp. 65-71
2015 ◽
Vol 1
(2)
◽
pp. 65
2021 ◽
Vol 19
(3)
◽
pp. 217-226
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Keyword(s):
Keyword(s):