Determination of Free Silicon in Sintered Silicon Nitride by Laser Raman Spectrometry

1989 ◽  
Vol 97 (1132) ◽  
pp. 1466-1470
Author(s):  
Atsushi CHINO ◽  
Hideo IWATA ◽  
Sirou TORIZUKA ◽  
Kazuya YABUTA
Keyword(s):  
Silicon Nitride ◽  
Raman Spectrometry ◽  
Laser Raman ◽  
Free Silicon ◽  
Sintered Silicon

scholarly journals Determination of trace impurities in sintered silicon carbide and silicon nitride by the pressure acid decomposition/ICP-AES.

1992 ◽  
Vol 41 (12) ◽  
pp. T151-T156 ◽  
Author(s):  
Yoshinori UWAMINO ◽  
Hisashi MORIKAWA ◽  
Akira TSUGE ◽  
Kiyoshi NAKANE ◽  
Yasuo IIDA ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Silicon Nitride ◽  
Acid Decomposition ◽  
Trace Impurities ◽  
Sintered Silicon

New method of free silicon determination in pressureless sintered silicon nitride by Raman spectroscopy and XRD

2019 ◽  
Vol 45 (11) ◽  
pp. 14338-14346 ◽  
Author(s):  
O.A. Lukianova ◽  
A.A. Parkhomenko ◽  
V.V. Krasilnikov ◽  
A.N. Khmara ◽  
A.P. Kuzmenko
Keyword(s):  
Raman Spectroscopy ◽  
Silicon Nitride ◽  
New Method ◽  
Free Silicon ◽  
Sintered Silicon

Identification and Determination of Oxygen-Containing Inorganosulfur Compounds by Laser Raman Spectrometry

1985 ◽  
Vol 39 (5) ◽  
pp. 822-827 ◽  
Author(s):  
Soei Sato ◽  
Seiichiro Higuchi ◽  
Shigeyuki Tanaka
Keyword(s):  
Raman Spectrometry ◽  
Laser Raman

Determination of nitrate ion in waste and treated waters by laser raman spectrometry

1979 ◽  
Vol 13 (4) ◽  
pp. 371-374 ◽  
Author(s):  
N FURUYA ◽  
A MATSUYUKI ◽  
S HIGUCHI ◽  
S TANAKA
Keyword(s):  
Raman Spectrometry ◽  
Nitrate Ion ◽  
Laser Raman

Determination of terminal thiol groups in sulfur polymers by laser Raman spectrometry

1978 ◽  
Vol 50 (11) ◽  
pp. 1591-1592 ◽  
Author(s):  
Samir K. Mukherjee ◽  
Gary D. Guenther ◽  
Arun K. Bhattacharya
Keyword(s):  
Thiol Groups ◽  
Raman Spectrometry ◽  
Laser Raman

Depolarization Ratio Measurements in Raman Spectrometry

1970 ◽  
Vol 24 (3) ◽  
pp. 348-353 ◽  
Author(s):  
Charly D. Allemand
Keyword(s):  
Experimental Methods ◽  
Depolarization Ratio ◽  
Instrumental Performance ◽  
Optimum Conditions ◽  
Raman Spectrometry ◽  
Raman Spectrometer ◽  
Laser Raman ◽  
Depolarization Ratios

The determination of depolarization ratios can be made accurately with a laser Raman spectrometer, and the precision of the measurements is more a function of the sample than of instrumental performance. Therefore the discussion of depolarization measurements will commence with a brief analysis of the fundamentals of Raman emission from the sample. Thereafter the discussion will take into account the influence of the spectrograph on depolarization measurements. The conclusions to be drawn from the considerations, together with the application of well known optical laws, will permit optimum conditions to be defined for accurate depolarization measurements. Finally, a review of eight different experimental methods proposed and suggested conditions for their use will be given.

ChemInform Abstract: OXIDATION OF THIN SHEET REACTION-SINTERED SILICON NITRIDE

1978 ◽  
Vol 9 (24) ◽  
Author(s):  
J. B. WARBURTON ◽  
J. E. ANTILL ◽  
R. W. M. HAWES
Keyword(s):  
Silicon Nitride ◽  
Thin Sheet ◽  
Sintered Silicon
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