Pass-Through with Endogenous Quality: An Empirical Study of Per-Passenger and Per-Flight Airport Charges

2019 ◽  
Author(s):  
Naoshi Doi
Keyword(s):  
Empirical Study ◽  
Endogenous Quality ◽  
Pass Through

scholarly journals An Empirical Study of Cost Pass-Through Ability of Airline Company in China

2014 ◽  
Vol 03 (01) ◽  
pp. 1-9 ◽  
Author(s):  
兴无 郑
Keyword(s):  
Empirical Study ◽  
Pass Through ◽  
Airline Company

Endogenous Quality and Exchange Rate Pass-Through

2016 ◽  
Author(s):  
Daniel Goetz ◽  
Alexander Rodnyansky
Keyword(s):  
Exchange Rate ◽  
Endogenous Quality ◽  
Pass Through ◽  
Exchange Rate Pass Through

scholarly journals Empirical Study on Maximum Traffic Throughputs at Intersections

2019 ◽  
Vol 259 ◽  
pp. 02008
Author(s):  
Patikhom Cheevarunothai ◽  
Ruangsak Kaewpikul
Keyword(s):  
Empirical Study ◽  
Traffic Congestion ◽  
Travel Speed ◽  
Accurate Estimation ◽  
Traffic Counts ◽  
Economy Growth ◽  
Vehicle Delay ◽  
Big Cities ◽  
Pass Through

Traffic congestion in big cities of Thailand has been a major problem seriously deterring economy growth. An average travel speed has become lower than 15 km/hour during peak-hour periods. One of the current major questions is how to find the most optimum green time that minimizes vehicle delay at an intersection. Since the identification of this optimum green time significantly depends on the knowledge of how fast vehicles can pass through an intersection, the information of the maximum traffic throughputs at intersections at different locations is indispensable. In this study, therefore, traffic counts were extracted manually from the videos recorded at 4 major intersections in Saensuk city. After the data were analyzed, the maximum traffic throughputs for different lane numbers and configurations were calculated and summarized. A better understanding of this maximum traffic throughput at intersections will lead to more accurate estimation of optimal green time.

Instrumentation for detecting channelling radiation in the high-voltage electron microscope

1983 ◽  
Vol 41 ◽  
pp. 318-319
Author(s):  
J. H. Butler ◽  
C. J. Humphreys
Keyword(s):  
Monochromatic Light ◽  
Incident Beam ◽  
Laboratory Frame ◽  
Relativistic Electrons ◽  
Voltage Electron ◽  
Dipole Emission ◽  
Sinusoidal Oscillations ◽  
Pass Through ◽  
Incident Beam Energy ◽  
Increasing Function

Electromagnetic radiation is emitted when fast (relativistic) electrons pass through crystal targets which are oriented in a preferential (channelling) direction with respect to the incident beam. In the classical sense, the electrons perform sinusoidal oscillations as they propagate through the crystal (as illustrated in Fig. 1 for the case of planar channelling). When viewed in the electron rest frame, this motion, a result of successive Bragg reflections, gives rise to familiar dipole emission. In the laboratory frame, the radiation is seen to be of a higher energy (because of the Doppler shift) and is also compressed into a narrower cone of emission (due to the relativistic “searchlight” effect). The energy and yield of this monochromatic light is a continuously increasing function of the incident beam energy and, for beam energies of 1 MeV and higher, it occurs in the x-ray and γ-ray regions of the spectrum. Consequently, much interest has been expressed in regard to the use of this phenomenon as the basis for fabricating a coherent, tunable radiation source.

Radiation Damage, Contrast and Statistics in High Resolution Biological Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 260-261
Author(s):  
Robert M. Glaeser
Keyword(s):  
High Resolution ◽  
Particle Flux ◽  
Unit Area ◽  
Signal To Noise ◽  
Resolution Image ◽  
High Resolution Image ◽  
Pass Through ◽  
Counting Statistics ◽  
The Relationship ◽  
Picture Element

It is well known that a large flux of electrons must pass through a specimen in order to obtain a high resolution image while a smaller particle flux is satisfactory for a low resolution image. The minimum particle flux that is required depends upon the contrast in the image and the signal-to-noise (S/N) ratio at which the data are considered acceptable. For a given S/N associated with statistical fluxtuations, the relationship between contrast and “counting statistics” is s131_eqn1, where C = contrast; r2 is the area of a picture element corresponding to the resolution, r; N is the number of electrons incident per unit area of the specimen; f is the fraction of electrons that contribute to formation of the image, relative to the total number of electrons incident upon the object.

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