scholarly journals Solid Electrolyte/Electrode Interfaces: Atomistic Behavior Analyzed Via UHV-AFM, Surface Spectroscopies, and Computer Simulations Computational and Experimental Studies of the Cathode/Electrolyte Interface in Oxide Thin Film Batteries

2012 ◽  
Author(s):  
Stephen Garofalini
2020 ◽  
Vol 152 (8) ◽  
pp. 084702 ◽  
Author(s):  
Hans-Georg Steinrück ◽  
Chuntian Cao ◽  
Gabriel M. Veith ◽  
Michael F. Toney

2006 ◽  
Vol 910 ◽  
Author(s):  
Wei Pan ◽  
R.G. Dunn ◽  
M.S. Carroll ◽  
Y.Q. Wang

AbstractIn this paper, we wish to report our preliminary experimental results from the photoluminescence (PL) studies in a Mn-ion implanted silicon-rich oxide (SRO) thin film. At 4 K, a broad PL peak, centered at ~ 1.2 eV, was observed. It is blue-shifted from the Si substrate peak at ~ 1.1 eV. The temperature (T) dependence of PL was carried out at zero magnetic (B) field and B = 0.5 Tesla, respectively, and showed quantitatively different behaviors. At B = 0, the PL intensity increases very slowly at low temperatures and reaches a maximal value at ~ 40 K. It then decreases as T is further increased. At B = 0.5 Tesla, the peak temperature (Tpeak), whether the intensity is maximal, moves to ~ 80-100 K, and the decreasing rate beyond Tpeak is much smaller than that at B = 0. We speculate that these two different behaviors might reveal, possibly, a ferromagnetic ordering in Mn-ion doped silicon nanocrystals.


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