scholarly journals Electron Energy-loss Spectroscopy Characterization of ∼1 nm-thick Amorphous Film at Grain Boundary in Si-based Ceramics

2004 ◽  
Vol 45 (7) ◽  
pp. 2091-2098 ◽  
Author(s):  
Hui Gu
2014 ◽  
Vol 115 (3) ◽  
pp. 034302 ◽  
Author(s):  
J. Palisaitis ◽  
A. Lundskog ◽  
U. Forsberg ◽  
E. Janzén ◽  
J. Birch ◽  
...  

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