Electron Energy-loss Spectroscopy Characterization of ∼1 nm-thick Amorphous Film at Grain Boundary in Si-based Ceramics
2004 ◽
Vol 45
(7)
◽
pp. 2091-2098
◽
Keyword(s):
1985 ◽
Vol 3
(3)
◽
pp. 1313-1314
◽
Keyword(s):
Keyword(s):
1989 ◽
Vol 163
(4-5)
◽
pp. 449-454
◽
Keyword(s):
2010 ◽
Vol 49
(11)
◽
pp. 111501
◽
1988 ◽
Vol 36
(9)
◽
pp. 2597-2604
◽
1994 ◽
Vol 253
(1-2)
◽
pp. 299-302
◽