Summary Abstract: Characterization of planar aluminas by x‐ray photoelectron and electron energy loss spectroscopy

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

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Using in situ electron energy-loss spectroscopy (EELS) and X-ray fluorescence microscopy (XFM) to characterize Co-Pt nanoparticles

Microscopy and Microanalysis ◽

10.1017/s1431927621007613 ◽

2021 ◽

Vol 27 (S1) ◽

pp. 2108-2109

Author(s):

Alexandre Foucher ◽

Nicholas Marcella ◽

Anna Plonka ◽

Anatoly Frenkel ◽

Eric Stach

Keyword(s):

Fluorescence Microscopy ◽

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Pt Nanoparticles ◽

X Ray ◽

Electron Energy Loss

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Surface characterization study of Ag, AgO, andAg2Ousing x-ray photoelectron spectroscopy and electron energy-loss spectroscopy

Physical Review B ◽

10.1103/physrevb.62.11126 ◽

2000 ◽

Vol 62 (16) ◽

pp. 11126-11133 ◽

Cited By ~ 232

Author(s):

Gar B. Hoflund ◽

Zoltan F. Hazos ◽

Ghaleb N. Salaita

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Photoelectron Spectroscopy ◽

Surface Characterization ◽

X Ray ◽

Characterization Study ◽

Electron Energy Loss

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Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique

Physical Review B ◽

10.1103/physrevb.33.5682 ◽

1986 ◽

Vol 33 (8) ◽

pp. 5682-5697 ◽

Cited By ~ 95

Author(s):

M. Liehr ◽

P. A. Thiry ◽

J. J. Pireaux ◽

R. Caudano

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Surface Potential ◽

Electron Energy Loss Spectroscopy ◽

Resolution Electron ◽

Stabilization Technique ◽

Electron Energy Loss

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Characterization of sapphire surfaces by electron energy-loss spectroscopy

Surface Science ◽

10.1016/0039-6028(92)90079-l ◽

1992 ◽

Vol 273 (3) ◽

pp. 427-436 ◽

Cited By ~ 72

Author(s):

E. Gillet ◽

B. Ealet

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Electron Energy Loss

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Microwave Fixation and Localization of Calcium in Synaptic Terminals and Muscular Cells by Electron Probe X-Ray Microanalysis and Electron Energy-Loss Spectroscopy Imaging.

ACTA HISTOCHEMICA ET CYTOCHEMICA ◽

10.1267/ahc.30.277 ◽

1997 ◽

Vol 30 (3) ◽

pp. 277-301 ◽

Cited By ~ 5

Author(s):

Vinci Mizuhira ◽

Hiroshi Hasegawa ◽

Mitsuru Notoya

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Electron Probe ◽

X Ray ◽

Synaptic Terminals ◽

Microwave Fixation ◽

Electron Energy Loss

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Parallel electron energy-loss spectroscopy and X-ray photoelectron spectroscopy of poly(ether ether ketone)

Polymer ◽

10.1016/0032-3861(93)90321-z ◽

1993 ◽

Vol 34 (8) ◽

pp. 1637-1643 ◽

Cited By ~ 19

Author(s):

R.S. Payne ◽

G. Beamson

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Ether Ether Ketone ◽

Poly Ether Ether Ketone ◽

Ether Ketone ◽

Electron Energy Loss

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Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and Microcrystals

Modern Developments and Applications in Microbeam Analysis ◽

10.1007/978-3-7091-7506-4_12 ◽

1998 ◽

pp. 87-92

Author(s):

Vladimir P. Oleshko ◽

Renaat H. Gijbels ◽

Willem A. Jacob ◽

Andre J. Daele

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Spectroscopic Imaging ◽

Energy Dispersive ◽

Electron Spectroscopic Imaging ◽

X Ray ◽

Electron Energy Loss

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