scholarly journals Grain Boundary Structure Dependence of Extrinsic Grain Boundary Dislocation Emission Phenomena: A Molecular Dynamics Study

2012 ◽  
Vol 53 (1) ◽  
pp. 147-155 ◽  
Author(s):  
Keisuke Kinoshita ◽  
Tomotsugu Shimokawa ◽  
Toshiyasu Kinari
Author(s):  
P. Humble

There has been sustained interest over the last few years into both the intrinsic (primary and secondary) structure of grain boundaries and the extrinsic structure e.g. the interaction of matrix dislocations with the boundary. Most of the investigations carried out by electron microscopy have involved only the use of information contained in the transmitted image (bright field, dark field, weak beam etc.). Whilst these imaging modes are appropriate to the cases of relatively coarse intrinsic or extrinsic grain boundary dislocation structures, it is apparent that in principle (and indeed in practice, e.g. (1)-(3)) the diffraction patterns from the boundary can give extra independent information about the fine scale periodic intrinsic structure of the boundary.In this paper I shall describe one investigation into each type of structure using the appropriate method of obtaining the necessary information which has been carried out recently at Tribophysics.


1997 ◽  
Vol 492 ◽  
Author(s):  
H. Van Swygenhoven ◽  
M. Spaczér ◽  
A. Caro

ABSTRACTMolecular dynamics computer simulations of high load plastic deformation at temperatures up to 500K of Ni nanophase samples with mean grain size of 5 nm are reported. Two types of samples are considered: a polycrystal nucleated from different seeds, each having random location and random orientation, representing a sample with mainly high angle grain boundaries, and polycrystals with seeds located at the same places as before, but with a limited missorientation representing samples with mainly low angle grain boundaries. The structure of the grain boundaries is studied by means of pair distribution functions, coordination number, atom energetics, and common neighbour analysis. Plastic behaviour is interpreted in terms of grain-boundary viscosity, controlled by a self diffusion mechanism at the disordered interface activated by thermal energy and stress.


1998 ◽  
Vol 516 ◽  
Author(s):  
Matithew M. Nowell ◽  
David P. Field

AbstractThe development of hillocks on metal films during annealing is detrimental to downstream processing of integrated circuit structures. This work focuses upon the local character of texture and grain boundary structure near hillocks in metal films. It is apparent from the results that local grain boundary structure and texture strength are important parameters in identifying locations in the films that are preferentially susceptible to failure under given conditions. Results in aluminum and platinum films indicate that non-(111) oriented grains preferentially contain hillocks. In addition, (111) oriented grains with boundaries characterized by high angle rotations about random axes are prone to hillock formation.


Author(s):  
S.E. Babcock

In 1970, an extensive search by transmission electron microscopy (TEM) for evidence of ordered structure in high-angle [001] twist boundaries helped to establish the credibility of the DSC/CSL description of grain boundary structure. In this work, square grids of line contrast were found in boundaries for which the twist misorientation (Θ) was very near the special Σ5+ Σ13 and Σ17 Θ. The lines ran parallel to the primitive translation vectors (b(1) and b(2)) of the appropriate low-Σ DSC lattice, and their spacing correlated well with the spacing predicted by Frank's formula for dislocations with Burgers vectors b(1) and b(2). The images were interpreted as secondary grain boundary dislocation (SGBD) networks. Only for the near-Σ5 case was g•b analysis carried out to show that the line contrast was characteristic of b= 1/10 <310> type screw SGBD's.


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