A pilot contamination avoidance based on pilot pattern design for ultra-dense network

2020 ◽  
Vol 17 (12) ◽  
pp. 235-246
Author(s):  
Jie Huang ◽  
Fan Yang ◽  
Yiwen Gao ◽  
Zhiming Wang ◽  
Jun Zhong
Author(s):  
Kai Sun ◽  
Jiarun Yu ◽  
Wei Huang ◽  
Haijun Zhang ◽  
Victor C.M. Leung

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