In this paper, a system consisting of three states: perfect functioning, partial functioning, and down is considered. The system is assumed to be composed of several non-identical groups of binary components. The reliability of the system states under various assumptions on the component lifetimes is investigated. For this purpose, first, a new concept of bivariate survival signature (BSS) is introduced. Then, under the assumption that the component lifetimes of each type are exchangeable dependent, representations for the joint reliability function of the state lifetimes are obtained based on the notion of BSS. In the particular case, three-state systems composed of two types of different modules such as general-series (parallel) systems and systems with component-wise redundancy are investigated. Several examples are presented to illustrate the theoretical results.
Reliability Performance of Improved General Series-Parallel Systems in the Generalized Exponential Lifetime Model
