A CROSS-SECTIONAL ANALYSIS OF WAIS-R AGING PATTERNS WITH PSYCHIATRIC INPATIENTS: SUPPORT FOR HORN'S HYPOTHESIS THAT FLUID COGNITIVE ABILITIES DECLINE

1995 ◽  
Vol 81 (2) ◽  
pp. 371-379 ◽  
Author(s):  
DANIEL E. BOONE
1995 ◽  
Vol 81 (2) ◽  
pp. 371-379
Author(s):  
Daniel E. Boone

WAIS–R aging patterns were examined for a group of 200 psychiatric inpatients. Inpatients were grouped into six age categories: less than 24, 24–28, 29–32, 33–38, 39–43, and greater than 43 years. Verbal and Performance sums of scaled score, subtest scaled score, and raw score total, and individual item score means were examined for each age category. The classical aging pattern was observed wherein more crystallized cognitive abilities remained stable over age groups of the life span while more fluid abilities dropped sharply with their increasing ages. Results supported the decline in fluid cognitive abilities hypothesis for WAIS–R aging patterns advocated by Horn in 1985 and Kaufman in 1990.


2012 ◽  
Vol 58 (4) ◽  
pp. 472-476 ◽  
Author(s):  
Caroline Filla Rosaneli ◽  
Flavia Auler ◽  
Carla Barreto Manfrinato ◽  
Claudine Filla Rosaneli ◽  
Caroline Sganzerla ◽  
...  

2017 ◽  
Vol 48 (S 01) ◽  
pp. S1-S45
Author(s):  
M. Zielonka ◽  
S. Garbade ◽  
S. Kölker ◽  
G. Hoffmann ◽  
M. Ries

2019 ◽  
Author(s):  
Patricia Clark ◽  
Annarella Barbato ◽  
Miguel Angel Guagnelli ◽  
Jose Alberto Rascon ◽  
Edgar Denova ◽  
...  

Diabetes ◽  
2020 ◽  
Vol 69 (Supplement 1) ◽  
pp. 2174-PUB
Author(s):  
NARAYANAN NK ◽  
CS DWARAKANATH ◽  
VENKATARAMAN S ◽  
MANIKANDAN RM ◽  
NARENDRA BS ◽  
...  

Author(s):  
B. Domengès ◽  
P. Poirier

Abstract In this study, the resistance of FIB prepared vias was characterized by the Kelvin probe technique and their physical characteristics studied using cross-sectional analysis. Two domains of resistivity were isolated in relation to the ion beam current used for the deposition of the via metal (Pt). Also submicrometer vias were investigated on 4.2 µm deep metal lines of a BiCMOS aluminum based design and a CMOS 090 copper based one. It is shown that the controlling parameter is the shape and volume of the contact, and that the contact formation is favored by the amount of over-mill of the via into the metal line it will contact.


2019 ◽  
Author(s):  
Yanink Caro-Vega ◽  
Pablo F. Belaunzarán-Zamudio ◽  
Jesús Alegre-Díaz ◽  
Brenda Crabtree-Ramírez ◽  
Raúl Ramírez-Reyes ◽  
...  

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