ANTICIPATING THE CORRECT MATCHING RESPONSE IN A SECOND-ORDER MATCHING-TO-SAMPLE TASK

2003 ◽  
Vol 93 (7) ◽  
pp. 1307
Author(s):  
EMILIO RIBES-INESTA
2003 ◽  
Vol 93 (3_suppl) ◽  
pp. 1307-1318
Author(s):  
Emilio Ribes-Iñesta ◽  
María Elena Rodríguez ◽  
M. Teresa Fuentes

A study was designed to evaluate the effects of anticipating the matching response on acquisition and transfer of a second-order matching-to-sample task. 40 college students of both sexes were assigned to different anticipation procedures that involved several verbal descriptions of the correct response, as well as others not involving explicit descriptions. All subjects were exposed to a pretest, two training blocks, two transfer test blocks, and a posttest. Anticipation procedures were evaluated during the first training block using an observational training procedure, except for 8 subjects, who were exposed to two training control procedures. Analysis showed acquisition and transfer of successful matching seems to depend on a verbal discrimination of the matching criterion exemplified by second-order stimuli. This discrimination was facilitated by prior conditions, as when subjects showed correct matching performance at pretest or was established with anticipation procedures that required explicit reading of verbal descriptions of the response choice.


2014 ◽  
Vol 15 (2) ◽  
pp. 149-163 ◽  
Author(s):  
Luis Alberto Quiroga Baquero ◽  
María Antonia Padilla Vargas ◽  
Cristiano Valerio dos Santos

Author(s):  
W. L. Bell

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.


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