scholarly journals Fatigue Lives Simulation in Sintered Silicon Nitride Based on Probability Distribution of Defects Size and Micro-Crack Propagation Behavior

2007 ◽  
Vol 56 (4) ◽  
pp. 357-363
Author(s):  
Akira UENO ◽  
Kunihiro MATSUNO
1992 ◽  
Vol 100 (1158) ◽  
pp. 117-121 ◽  
Author(s):  
Satoshi IIO ◽  
Tomonori NIWA ◽  
Yo TAJIMA ◽  
Masakazu WATANABE

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