In-situ Debris Measurements in GEO through Optical Surface Inspection

Author(s):  
Hiroshi Hirayama
2021 ◽  
pp. 152358
Author(s):  
Yuhai Li ◽  
Qingshun Bai ◽  
Caizhen Yao ◽  
Peng Zhang ◽  
Rongqi Shen ◽  
...  

Electronics ◽  
2020 ◽  
Vol 9 (11) ◽  
pp. 1824 ◽  
Author(s):  
Lino Antoni Giefer ◽  
Benjamin Staar ◽  
Michael Freitag

Quantization of the weights and activations of a neural network is a way to drastically reduce necessary memory accesses and to replace arithmetic operations with bit-wise operations. This is especially beneficial for the implementation on field-programmable gate array (FPGA) technology that is particularly suitable for embedded systems due to its low power consumption. In this paper, we propose an in-situ defect detection system utilizing a quantized neural network implemented on an FPGA for an automated surface inspection of wind turbine rotor blades using unpiloted aerial vehicles (UAVs). Contrary to the usual approach of offline defect detection, our approach prevents major downtimes and hence expenses. To our best knowledge, our work is among the first to transfer neural networks with weight and activation quantization into a tangible application. We achieve promising results with our network trained on our dataset consisting of 8024 good and defected rotor blade patches. Compared to a conventional network using floating-point arithmetic, we show that the classification accuracy we achieve is only slightly reduced by approximately 0.6%. With this work, we present a basic system for in-situ defect detection with versatile usability.


1988 ◽  
Vol 67 (1) ◽  
pp. 34-38
Author(s):  
A. Oulamara ◽  
M. Spajer ◽  
G. Tribillon ◽  
J. Duvernoy

2017 ◽  
Vol 84 (7-8) ◽  
Author(s):  
Haiyue Yang ◽  
Tobias Haist ◽  
Marc Gronle ◽  
Wolfgang Osten

AbstractLack of training data is one of the main problems when realizing optical surface inspection systems. In the best case, provision of enough representative training samples is difficult and most of the time expensive. In some cases, it is not possible at all. Here we present an alternative method where the surface defects are simulated. Thereby, we focus on metal surfaces in the microscale where diffraction phenomena start to play a major role. Ray tracing and scalar diffraction approximation methods are applied and compared.


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