Analisis Misalignment Citra Multispektral Terhadap Citra Pankromatik Pada Data Worldview-2

The standard data of Worldview-2 owned by LAPAN is Ortho-Ready Standard level 2 (OR2A) data consisting of 4 multispectral bands (blue, green, red, NIR) and one panchromatic band each 2 m and 0,5 m spatial resolution. Both images have different metadata and RPC, making it possible to perform geometric corrections separately. This paper discusses the analysis of the inaccuracies of multispectral image positions to panchromatic images compared to those that have been systematically geometric corrected. The method used is fast fourier transform phase matching by taking 500 binding points between the two images. The measurement results prove that the multispectral image of the Worldview-2 data of the OR2A level has a larger shift compared with multispectral image that has been systematically geometric corrected. The multispectral image of the OR2A data shifts are 2,14 m on the X-axis and 0,42 m on the Y-axis. While the multispectral image that has been systematically geometric corrected shifts are 1,72 m on the X-axis and 0,54 m on the Y-axis.ABSTRAKData standar Worldview-2 yang dimiliki oleh LAPAN merupakan data Ortho-Ready Standard level 2 (OR2A) yang terdiri dari 4 kanal multispektral (biru, hijau, merah, NIR) dan satu kanal pankromatik masing-masing memiliki resolusi spasial 2 meter dan 0,5 meter. Kedua kanal tersebut memiliki metadata dan RPC yang berbeda, sehingga memungkinkan untuk melakukan koreksi geometrik secara terpisah. Tulisan ini membahas tentang analisis misalignment citra multispektral terhadap citra pankromatik dibandingkan dengan yang telah terkoreksi geometrik sistematik. Metode yang digunakan adalah fast fourier transform phase matching dengan mengambil 500 titik ikat antara kedua citra tersebut. Hasil pengukuran membuktikan bahwa citra multispektral data Worldview-2 level OR2A memiliki pergeseran yang lebih besar dibandingkan dengan citra multispektral yang terkoreksi geometrik sistematik. Citra multispektral data OR2A bergeser 2,14 meter pada sumbu X dan 0,42 meter pada sumbu Y. Sedangkan citra multispektral data terkoreksi geometrik sistematik bergeser 1,72 meter pada sumbu X dan 0,54 meter pada sumbu Y.

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Rapid Fast Fourier Transform Phase Alignment of an Electronically Scanned Antenna

10.1109/euma.1990.336051 ◽

1990 ◽

Cited By ~ 10

Author(s):

Harold Shnitkin

Keyword(s):

Fourier Transform ◽

Fast Fourier Transform ◽

Phase Alignment ◽

Fourier Transform Phase

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Fast Fourier Transform Techniques for Measuring SEM Resolution

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180781 ◽

1990 ◽

Vol 48 (1) ◽

pp. 406-407 ◽

Cited By ~ 1

Author(s):

A. Dodson ◽

D. C. Joy

Keyword(s):

Fourier Transform ◽

High Resolution ◽

Fast Fourier Transform ◽

Surface Structure ◽

Spatial Resolution ◽

Instrumental Performance ◽

Performance Limits ◽

Maximum Resolution ◽

Accurate Interpretation ◽

Precise Knowledge

Precise knowledge of a particular SEM's resolution is important for at least two reasons to the microscopist operating the instrument. First, accurate interpretation of micrographs obtained in the course of daily operation depends on knowing the performance limits of the instrument. Second, it is important for the microscopist to be able to verify instrumental performance.Spatial resolution is typically determined using micrographs of materials containing structures having a “known” spacing. By showing that two objects in the micrograph are separated by some distance, it is claimed that the instrument is capable of resolving this spacing. This method is passable for instruments whose maximum resolution resolves only features of known spacing. However, for High Resolution SEM's (HRSEM) this method is not adequate. It is difficult to identify specimens with surface structure that can be verified to exist at the ultimate limits of today's HRSEM resolution. The fact that verifying resolution by this method depends on being able to verify the spacing of surface structure on a particular specimen leads to an interesting paradox - the resolution of a given instrument can be verified only after a better instrument is available to characterize the structure spacing.

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