scholarly journals Features of single event transients in CMOS combinational logic circuits caused by charge collection from tracks of single nuclear particles

Author(s):  
Yu.V. Katunin ◽  
V.Ya. Stenin ◽  
◽  
2008 ◽  
Vol 55 (6) ◽  
pp. 3342-3346 ◽  
Author(s):  
M. C. Casey ◽  
O. A. Amusan ◽  
S. A. Nation ◽  
T. D. Loveless ◽  
A. Balasubramanian ◽  
...  

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