Features of single event transients in CMOS combinational logic circuits caused by charge collection from tracks of single nuclear particles
2017 ◽
Vol 69
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pp. 109-114
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2008 ◽
Vol 55
(6)
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pp. 3342-3346
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Keyword(s):
1987 ◽
Vol 34
(6)
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pp. 1386-1391
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Keyword(s):
1986 ◽
Vol C-35
(8)
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pp. 742-754
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Keyword(s):