A Detailed Characterization of Errors in Logic Circuits due to Single-Event Transients

2015 Euromicro Conference on Digital System Design ◽

10.1109/dsd.2015.58 ◽

2015 ◽

Author(s):

Nanditha P. Rao ◽

Madhav P. Desai

Keyword(s):

Logic Circuits ◽

Single Event ◽

Detailed Characterization ◽

Single Event Transients

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An Efficient Design of Single Event Transients Tolerance for Logic Circuits

4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) ◽

10.1109/delta.2008.9 ◽

2008 ◽

Author(s):

Yantu Mo ◽

Suge Yue

Keyword(s):

Logic Circuits ◽

Single Event ◽

Efficient Design ◽

Single Event Transients

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Radiation hardened by design technique to mitigate single event transients in combinational logic circuits

2017 International Conference on Recent Innovations in Signal processing and Embedded Systems (RISE) ◽

10.1109/rise.2017.8378178 ◽

2017 ◽

Author(s):

Tokala Vinay Reddy ◽

Sangeeta Nakhate

Keyword(s):

Logic Circuits ◽

Combinational Logic ◽

Single Event ◽

Design Technique ◽

Single Event Transients ◽

Radiation Hardened ◽

Combinational Logic Circuits ◽

Radiation Hardened By Design

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Design sensitivity of single event transients in scaled logic circuits

Proceedings of the 48th Design Automation Conference on - DAC '11 ◽

10.1145/2024724.2024881 ◽

2011 ◽

Author(s):

Jyothi Velamala ◽

Robert LiVolsi ◽

Myra Torres ◽

Yu Cao

Keyword(s):

Design Sensitivity ◽

Logic Circuits ◽

Single Event ◽

Single Event Transients

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Experimental characterization of the bipolar effect on P-hit single-event transients in 65 nm twin-well and triple-well CMOS technologies

Science China Technological Sciences ◽

10.1007/s11431-015-5999-5 ◽

2016 ◽

Vol 59 (3) ◽

pp. 488-493 ◽

Author(s):

JianJun Chen ◽

Bin Liang ◽

YaQing Chi

Keyword(s):

Experimental Characterization ◽

Single Event ◽

Single Event Transients

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Impact of negative bias temperature instability on single event transients in scaled logic circuits

International Journal of Numerical Modelling Electronic Networks Devices and Fields ◽

10.1002/jnm.2854 ◽

2021 ◽

Author(s):

Ambika Prasad Shah ◽

Michael Waltl

Keyword(s):

Logic Circuits ◽

Negative Bias ◽

Single Event ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Single Event Transients

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Features of single event transients in CMOS combinational logic circuits caused by charge collection from tracks of single nuclear particles

Problems of advanced micro- and nanoelectronic systems development ◽

10.31114/2078-7707-2020-2-95-102 ◽

2020 ◽

pp. 95-102

Author(s):

Yu.V. Katunin ◽

V.Ya. Stenin ◽

◽

Keyword(s):

Logic Circuits ◽

Charge Collection ◽

Combinational Logic ◽

Single Event ◽

Single Event Transients ◽

Combinational Logic Circuits

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Single Event Transients in Logic Circuits—Load and Propagation Induced Pulse Broadening

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2006265 ◽

2008 ◽

Vol 55 (6) ◽

pp. 2928-2935 ◽

Author(s):

Gilson Wirth ◽

Fernanda L Kastensmidt ◽

Ivandro Ribeiro

Keyword(s):

Logic Circuits ◽

Single Event ◽

Single Event Transients ◽

Pulse Broadening

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Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131403 ◽

2011 ◽

Author(s):

N. J. Gaspard ◽

J. R. Ahlbin ◽

P. M. Gouker ◽

N. M. Atkinson ◽

M. J. Gadlage ◽

...

Keyword(s):

Floating Body ◽

Single Event ◽

Single Event Transients

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Characterization of the Total Charge and Time Duration for Single-Event Transients Voltage Pulses in a 65 nm CMOS Technology

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2022.3141070 ◽

2022 ◽

pp. 1-1

Author(s):

Zheyi Li ◽

Laurent Berti ◽

Jan Wouters ◽

Jialei Wang ◽

Paul Leroux

Keyword(s):

Cmos Technology ◽

Total Charge ◽

Single Event ◽

Time Duration ◽

Single Event Transients ◽

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Characterization of Single-Event Transients in Schmitt Trigger Inverter Chains Operating at Subthreshold Voltages

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2016.2629448 ◽

2017 ◽

Vol 64 (1) ◽

pp. 637-642 ◽

Author(s):

Matthew J. Gadlage ◽

Jonathan R. Ahlbin ◽

Peter Gadfort ◽

Austin H. Roach ◽

Scott Stansberry

Keyword(s):

Schmitt Trigger ◽

Single Event ◽

Single Event Transients

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