Non-equilibrium contact quantities and compound deficiency at interfaces between discrete systems; 133–145

AbstractNon-equilibrium processes in Schottky systems generate by projection onto the equilibrium subspace reversible accompanying processes for which the non-equilibrium variables are functions of the equilibrium ones. The embedding theorem which guarantees the compatibility of the accompanying processes with the non-equilibrium entropy is proved. The non-equilibrium entropy is defined as a state function on the non-equilibrium state space containing the contact temperature as a non-equilibrium variable. If the entropy production does not depend on the internal energy, the contact temperature changes into the thermostatic temperature also in non-equilibrium, a fact which allows to use temperature as a primitive concept in non-equilibrium. The dissipation inequality is revisited, and an efficiency of generalized cyclic processes beyond the Carnot process is achieved.

Download Full-text

Application of analytical electron microscopy to studies of equilibrium and non-equilibrium segregation in materials

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130705 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1214-1215

Author(s):

Edward A Kenik

Keyword(s):

Electron Microscopy ◽

Analytical Electron Microscopy ◽

Extended Defects ◽

Probe Diameter ◽

Specimen Holder ◽

Analytical Electron ◽

Scanning Transmission ◽

Solute Atoms ◽

Equilibrium Segregation ◽

Non Equilibrium

Segregation of solute atoms to grain boundaries, dislocations, and other extended defects can occur under thermal equilibrium or non-equilibrium conditions, such as quenching, irradiation, or precipitation. Generally, equilibrium segregation is narrow (near monolayer coverage at planar defects), whereas non-equilibrium segregation exhibits profiles of larger spatial extent, associated with diffusion of point defects or solute atoms. Analytical electron microscopy provides tools both to measure the segregation and to characterize the defect at which the segregation occurs. This is especially true of instruments that can achieve fine (<2 nm width), high current probes and as such, provide high spatial resolution analysis and characterization capability. Analysis was performed in a Philips EM400T/FEG operated in the scanning transmission mode with a probe diameter of <2 nm (FWTM). The instrument is equipped with EDAX 9100/70 energy dispersive X-ray spectrometry (EDXS) and Gatan 666 parallel detection electron energy loss spectrometry (PEELS) systems. A double-tilt, liquid-nitrogen-cooled specimen holder was employed for microanalysis in order to minimize contamination under the focussed spot.

Download Full-text