Automated Optically Guided System for Chemical Analysis of Single Plant and Algae Cells Using Laser Microdissection/Liquid Vortex Capture/Mass Spectrometry

Frontiers in Plant Science ◽

10.3389/fpls.2018.01211 ◽

2018 ◽

Vol 9 ◽

Author(s):

John F. Cahill ◽

Vilmos Kertesz

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Laser Microdissection ◽

Single Plant ◽

Liquid Vortex ◽

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Online, Absolute Quantitation of Propranolol from Spatially Distinct 20- and 40-μm Dissections of Brain, Liver, and Kidney Thin Tissue Sections by Laser Microdissection–Liquid Vortex Capture–Mass Spectrometry

Analytical Chemistry ◽

10.1021/acs.analchem.6b01155 ◽

2016 ◽

Vol 88 (11) ◽

pp. 6026-6034 ◽

Author(s):

John F. Cahill ◽

Vilmos Kertesz ◽

Taylor M. Weiskittel ◽

Marissa Vavrek ◽

Carol Freddo ◽

...

Keyword(s):

Mass Spectrometry ◽

Laser Microdissection ◽

Absolute Quantitation ◽

Tissue Sections ◽

Liver And Kidney ◽

Liquid Vortex ◽

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Laser Capture Microdissection–Liquid Vortex Capture Mass Spectrometry Metabolic Profiling of Single Onion Epidermis and Microalgae Cells

Methods in Molecular Biology - Single Cell Metabolism ◽

10.1007/978-1-4939-9831-9_7 ◽

2019 ◽

pp. 89-101

Author(s):

John F. Cahill ◽

Vilmos Kertesz

Keyword(s):

Mass Spectrometry ◽

Laser Capture Microdissection ◽

Metabolic Profiling ◽

Liquid Vortex ◽

Vortex Capture ◽

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Transmission geometry laser ablation into a non-contact liquid vortex capture probe for mass spectrometry imaging

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.6946 ◽

2014 ◽

Vol 28 (15) ◽

pp. 1665-1673 ◽

Author(s):

Olga S. Ovchinnikova ◽

Deepak Bhandari ◽

Matthias Lorenz ◽

Gary J. Van Berkel

Keyword(s):

Mass Spectrometry ◽

Laser Ablation ◽

Mass Spectrometry Imaging ◽

Capture Probe ◽

Transmission Geometry ◽

Liquid Vortex ◽

Vortex Capture ◽

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Quantitation of amiodarone and N-desethylamiodarone in single HepG2 cells by single-cell printing-liquid vortex capture-mass spectrometry

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-021-03652-6 ◽

2021 ◽

Author(s):

John F. Cahill ◽

Vilmos Kertesz

Keyword(s):

Mass Spectrometry ◽

Single Cell ◽

Hepg2 Cells ◽

Cell Printing ◽

Liquid Vortex ◽

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Characterization and Application of a Hybrid Optical Microscopy/Laser Ablation Liquid Vortex Capture/Electrospray Ionization System for Mass Spectrometry Imaging with Sub-micrometer Spatial Resolution

Analytical Chemistry ◽

10.1021/acs.analchem.5b03293 ◽

2015 ◽

Vol 87 (21) ◽

pp. 11113-11121 ◽

Author(s):

John F. Cahill ◽

Vilmos Kertesz ◽

Gary J. Van Berkel

Keyword(s):

Mass Spectrometry ◽

Laser Ablation ◽

Optical Microscopy ◽

Electrospray Ionization ◽

Spatial Resolution ◽

Mass Spectrometry Imaging ◽

Liquid Vortex ◽

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Deep proteomic characterization of fiber types of murine muscles by laser microdissection and mass spectrometry

10.1055/s-0039-1684953 ◽

2019 ◽

Author(s):

B Eggers ◽

K Schork ◽

R Schröder ◽

CS Clemen ◽

C Berwanger ◽

...

Keyword(s):

Mass Spectrometry ◽

Laser Microdissection ◽

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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/02007712 ◽

2000 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/30153671 ◽

2010 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

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Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

10.3403/30199194 ◽

2011 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Mass Spectrometer ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Surface Chemical ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Surface Chemical Analysis

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Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon

10.3403/30199170u ◽

2015 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiling ◽

Surface Chemical ◽

Spectrometry Method ◽

Mass Spectrometry Method ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Surface Chemical Analysis

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