Surface chemical analysis. Guidelines for preparation and mounting of specimens for analysis

Mapping Intimacies ◽

10.3403/30118290u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Surface Chemical ◽

Surface Chemical Analysis

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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/02007712 ◽

2000 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

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Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use

10.3403/02144326u ◽

2015 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Surface Chemical Analysis

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Surface chemical analysis. Vocabulary

10.3403/02332664 ◽

2001 ◽

Keyword(s):

Chemical Analysis ◽

Surface Chemical ◽

Surface Chemical Analysis

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Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis

10.3403/02704860 ◽

2002 ◽

Keyword(s):

High Resolution ◽

Chemical Analysis ◽

Auger Electron ◽

Chemical State ◽

Surface Chemical ◽

Surface Chemical Analysis ◽

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Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

10.3403/03239721 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Surface Chemical ◽

Performance Parameters ◽

Instrumental Performance ◽

X Ray ◽

Surface Chemical Analysis

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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

10.3403/03239706u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Surface Chemical ◽

X Ray ◽

Charge Control ◽

Surface Chemical Analysis

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Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale

10.3403/03239681u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron ◽

Surface Chemical ◽

Intensity Scale ◽

X Ray ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale

10.3403/03267940 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

Intensity Scale ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation

10.3403/30138808u ◽

2015 ◽

Keyword(s):

Reference Material ◽

Chemical Analysis ◽

Ion Implantation ◽

Surface Chemical ◽

Surface Chemical Analysis

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