Spectroscopic Ellipsometry Characterization of Hydrogenated Amorphous Silicon Thin Film
Keyword(s):
2016 ◽
Vol 51
(11)
◽
pp. 2777-2785
◽
2019 ◽
Vol 95
◽
pp. 20-27
2002 ◽
Vol 20
(3)
◽
pp. 1038-1042
◽
2016 ◽
Vol 302
◽
pp. 31-38
◽
1988 ◽
Vol 58
(4)
◽
pp. 389-410
◽
2011 ◽
Vol 50
(7R)
◽
pp. 074203
◽