Spectroscopic Ellipsometry Characterization of Hydrogenated Amorphous Silicon Thin Film

2013 ◽  
Vol 33 (10) ◽  
pp. 1031001
Author(s):  
何剑 He Jian ◽  
李伟 Li Wei ◽  
徐睿 Xu Rui ◽  
郭安然 Guo Anran ◽  
祁康成 Qi Kangcheng ◽  
...  
1991 ◽  
Vol 69 (4) ◽  
pp. 2339-2345 ◽  
Author(s):  
J. Kanicki ◽  
F. R. Libsch ◽  
J. Griffith ◽  
R. Polastre

2016 ◽  
Vol 302 ◽  
pp. 31-38 ◽  
Author(s):  
Tiejun Meng ◽  
Kwo Young ◽  
David Beglau ◽  
Shuli Yan ◽  
Peng Zeng ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document