scholarly journals A self‐consistent analysis of temperature‐dependent field‐effect measurements in hydrogenated amorphous silicon thin‐film transistors

1986 ◽  
Vol 60 (2) ◽  
pp. 643-649 ◽  
Author(s):  
R. E. I. Schropp ◽  
J. Snijder ◽  
J. F. Verwey
1991 ◽  
Vol 69 (4) ◽  
pp. 2339-2345 ◽  
Author(s):  
J. Kanicki ◽  
F. R. Libsch ◽  
J. Griffith ◽  
R. Polastre

1995 ◽  
Vol 30 (9) ◽  
pp. 2254-2256 ◽  
Author(s):  
Bor -Yir Chen ◽  
Wei -Hsiung Wu ◽  
Jiann -Ruey Chen ◽  
Chum -Sam Hong

Sign in / Sign up

Export Citation Format

Share Document