Determination of the effect of a strain relaxation layer on the internal electric field measurement in an InGaN/GaN multiple-quantum-well structure by using electroreflectance spectroscopy
2013 ◽
Vol 62
(9)
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pp. 1291-1294
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1988 ◽
Vol 4
(3)
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pp. 281-285
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2012 ◽
Vol 51
(10R)
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pp. 100201
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2012 ◽
Vol 51
◽
pp. 100201
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2014 ◽
Vol 211
(2)
◽
pp. 444-448
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Keyword(s):
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