Effects of floating gate structures on the two-dimensional electron gas density and electron mobility in AlGaN/AlN/GaN heterostructure field-effect transistors

2017 ◽  
Vol 71 (12) ◽  
pp. 963-967 ◽  
Author(s):  
Jingtao Zhao ◽  
Zhenguo Zhao ◽  
Zidong Chen ◽  
Zhaojun Lin ◽  
Fukai Xu
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