Determination of Bond Lengths and Electronic Structure of Cd1-xZnxTe Ternary Alloys by Synchrotron Radiation

2013 ◽  
Vol 706-708 ◽  
pp. 56-59 ◽  
Author(s):  
Wei Zheng ◽  
Yu Li Wu ◽  
Yen Ting Chen ◽  
Zhe Chuan Feng ◽  
Jyh Fu Lee ◽  
...  

High-resolution synchrotron radiation x-ray absorption spectroscopy on Zn K-, Cd L3- and Te L3-edges for Cd1-xZnxTe ternary alloys with x = 0.10, 0.30, 0.50 and 0.90 are presented. A detailed analysis of the extended x-ray absorption fine structure using the IFEFFIT program, and the chemical bonds of Zn-Te are obtained, suggesting distortion of the Te sub-lattice. The x-ray absorption near-edge structure of the Zn K-, Cd L3- and Te L3-edge are investigated, and the electronic structures of Cd1-xZnxTe with various compositions are studied.

2013 ◽  
Vol 634-638 ◽  
pp. 2489-2492 ◽  
Author(s):  
Wei Zheng ◽  
Ling Yun Jang ◽  
Jenn Min Lee ◽  
Rui Sheng Zheng ◽  
Chee Wee Liu ◽  
...  

High-resolution synchrotron radiation x-ray absorption data on Mn K- and L3-edge for semimagnetic semiconductor Zn1-xMnxTe bulk materials are presented. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program, and the chemical bonds of Mn-Te are obtained. The x-ray absorption near-edge structure of the Mn K- and L3-edges are investigated, and the electronic structure of Zn1-xMnxTe with various compositions are studied.


2013 ◽  
Vol 663 ◽  
pp. 361-365 ◽  
Author(s):  
Wei Zheng ◽  
Zhe Chuan Feng ◽  
Fan Hsiu Chang ◽  
Jyh Fu Lee ◽  
Rui Sheng Zheng ◽  
...  

High-resolution K-edge x-ray absorption data are presented for Mg, Zn and O of Mg1-xZnxO films. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program is given, and the Zn form chemical bonds with O are obtained. The x-ray absorption near-edge structure of Mg, Zn and O K-edge are investigated, and the electronic structures of Mg1-xZnxO with various compositions are studied.


2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.


1988 ◽  
Vol 143 ◽  
Author(s):  
Joe Wong ◽  
Glen A. Slack

The bonding and local atomic structure of a series of 3d metal-beta boron solid solution are investigated using a combination of x-ray absorption near-edge structure (XANES) and extended fine structure (EXAFS) technique utilizing intense synchrotron radiation as a light source. The corresponding metal diborides MB2, (M = Sc, Ti, V, Cr).were also measured and used to model the coordination environment of these metal sites in beta-boron.


2009 ◽  
Author(s):  
Yu Li Wu ◽  
Yen-Ting Chen ◽  
Zhe Chuan Feng ◽  
Jyh-Fu Lee ◽  
P. Becla ◽  
...  

1988 ◽  
Vol 143 ◽  
Author(s):  
G. R. Harp ◽  
B. P. Tonner

AbstractAs a spectroscopic technique, x-ray absorption near-edge structure (XANES) of core-levels using synchrotron radiation is in wide-spread use for the determination of the molecular composition of solid surfaces. A common detection method measures the yield of secondary electrons, which is proportional to the x-ray absorption coefficient for sufficiently high photon energy. In the experiments reported here, we show how the secondary electrons emitted as a result of photoabsorption can be used to generate a magnified image of the sample surface, with fundamental spatial limits determined by the deBroglie wavelength of the emitted electrons. Contrast in the secondary electron spatial distribution contains both topographical and chemical information about the sample surface. The use of tunable synchrotron radiation enables us to separate these contributions to the microscopic image, and to spatially resolve surface chemical composition as reflected in micro-XANES spectra.


2021 ◽  
Vol 28 (2) ◽  
pp. 448-454
Author(s):  
Selma Erat ◽  
Osman Murat Ozkendir ◽  
Saadet Yildirimcan ◽  
Selen Gunaydin ◽  
Messaoud Harfouche ◽  
...  

X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine-structure (EXAFS) spectra were recorded to investigate the electronic structure and local crystal structure of ZnO and ZnO:B powders produced via hydrothermal synthesis. ZnO and ZnO:B grow as micrometre-scale rods with hexagonal shape, as confirmed by scanning electron microscopy micrographs. The number of broken ZnO:B rods increases with increasing B concentration, as observed in the images, due to B atoms locating in between the Zn and O atoms which weakens and/or breaks the Zn–O bonds. However, no disorder within the crystallographic structure of ZnO upon B doping is observed from X-ray diffraction results, which were supported by EXAFS results. To determine the atomic locations of boron atoms in the crystal structure and their influence on the zinc atoms, EXAFS data were fitted with calculated spectra using the crystal structure parameters obtained from the crystallographic analysis of the samples. EXAFS data fitting and complementary k-weight analysis revealed the positions of the B atoms – their positions were determined to be in between the Zn and O atoms.


2003 ◽  
Vol 107 (46) ◽  
pp. 12562-12565 ◽  
Author(s):  
Shuji Matsuo ◽  
Ponnusamy Nachimuthu ◽  
Dennis W. Lindle ◽  
Hisanobu Wakita ◽  
Rupert C. C. Perera

1998 ◽  
Vol 4 (S2) ◽  
pp. 154-155
Author(s):  
H. Ade

In Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, excitations of core electrons into unoccupied molecular orbitals or electronic states provide sensitivity to a wide variety of chemical functionalities in molecules and solids. This sensitivity complements infrared (IR) spectroscopy, although the NEXAFS spectra are not quite as specific and “rich” as IR spectra. The sensitivity of NEXAFS to distinguish chemical bonds and electronic structures covers a wide variety of samples: from metals to inorganics and organics. (There is a tendency in the community to use the term NEXAFS for soft x-ray spectroscopy of organic materials, while for inorganic materials or at higher energies X-ray Absorption Near Edge Spectroscopy (XANES) is utilized, even though the fundamental physics is the same.) The sensitivity of NEXAFS is particularly high to distinguish saturated from unsaturated bonds. NEXAFS can also detect conjugation in a molecule, as well as chemical shifts due to heteroatoms.


2005 ◽  
Vol 21 (7) ◽  
pp. 769-773 ◽  
Author(s):  
Masaki TAKAOKA ◽  
Satoshi FUKUTANI ◽  
Takashi YAMAMOTO ◽  
Masato HORIUCHI ◽  
Naoya SATTA ◽  
...  

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