Study of Simulation Test Generation Method Based on Improved Binary Particle Swarm Optimization Algorithm
Keyword(s):
To solve the backdating problem of traditional test generation methods, it puts forward a new test generation method based on improved binary particle swarm optimization algorithm in the paper. It estates the fitness function of test vector and faults in the circuits, and the optimal solution is the maximal value of the function. The experimentations prove that the method can reduce the compute quantity of test generation.
2016 ◽
Vol 11
(1)
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pp. 58-67
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2013 ◽
Vol 475-476
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pp. 956-959
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2015 ◽
Vol 86
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pp. 182-193
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