Micromagnetic Simulation on Ground State Domain Structures of Barium Hexaferrite (BaFe12O19)

2014 ◽  
Vol 896 ◽  
pp. 414-417 ◽  
Author(s):  
Dede Djuhana ◽  
Dita C.C. Oktri ◽  
D.H. Kim

We have systematically investigated the domain structures of Barium Hexaferrite (BaFe12O19) by means of a micromagnetic simulation under zero external magnetic field. A hexagonal-shaped and cylindrical-shaped models are used in this simulation with respect to the diameter variation from 50 nm to 600 nm. A transition domain structure is found from a single-domain (SD) to multi-domain (MD) at a certain diameter. The hexagonal-shaped occurs in diameter 430 nm and cylindrical-shaped in diameter 410 nm. Interestingly, the domain wall of MD structure exhibits a Bloch-wall type. The domain wall width is determined by full width half maximum (FWHM) method from the transverse magnetization component data. The domain wall width from simulation showed close to Kittel’s formula

2007 ◽  
Vol 101 (9) ◽  
pp. 09F504 ◽  
Author(s):  
Se Dong Kim ◽  
Byong Sun Chun ◽  
Young Keun Kim

2005 ◽  
Vol 72 (10) ◽  
Author(s):  
S. Bodea ◽  
W. Wulfhekel ◽  
J. Kirschner

2001 ◽  
Vol 89 (11) ◽  
pp. 7203-7205
Author(s):  
S. Mangin ◽  
C. Bellouard ◽  
P. Turban ◽  
S. Andrieu ◽  
F. Canet ◽  
...  

Author(s):  
Raja K. Mishra

It is now well established that quantitative measurement of domain wall width using Lorentz electron microscopy is nontrivial. The usual technique of extrapolating divergent wall image widths of over-focussed or under-focussed Fresnel images suffers from serious errors since it is based on geometrical considerations and does not take into account the wave optical effects of electron scattering in the microscope. These errors are overcome if one supplements the measurements with image computation for the specific electron optical system and the specimen configuration. Another way of circumventing the errors is by using Differential Phase Contrast Microscopy in a Scanning Transmission Microscope which unfortunately requires instrumentation changes in the electron source and the electron detection system. In this paper we describe a simple method of calculating quantitative values of domain wall energy and domain wall width from Fresnel images obtainable in any standard transmission electron microscope.


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