Analyzing the Grating Profile Parameters Based on Scanning-Electron Microscope Images

Measuring grating profiles is very helpful for the analysis of specifications of gratings and improvement of grating fabrication techniques. We analyzed grating grooves by digitizing the scanning-electron microscope (SEM) images. Some kinds of filter and arithmetic were developed to extract the contour line of grating profile. In order to analyze the diffraction efficiency affected by the shape of grating profile, the calculated diffraction efficiency based on the SEM image and measured diffraction efficiency based on experiment was compared and analyzed.

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Damage-less observation of polymers by electron dose control in scanning electron microscope

Microscopy ◽

10.1093/jmicro/dfab006 ◽

2021 ◽

Author(s):

Yoichiro Hashimoto ◽

Kunji Shigeto ◽

Ryo Komatsuzaki ◽

Tsutomu Saito ◽

Takashi Sekiguchi

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Radiation Damage ◽

Signal To Noise Ratio ◽

Sem Images ◽

Rapid Reduction ◽

Electron Dose ◽

Sem Image ◽

Dose Control ◽

Scanning Electron

Abstract Methodology for quantitative evaluation of electron radiation damage and calculation of tolerable electron dose was developed to achieve damage-less scanning electron microscope (SEM) observation of beam-sensitive polymer film. The radiation damage is typically evaluated with visual impressions of SEM images; however, this method may be unreliable because observer’s subjectivity may affect the results. Evaluation with quantitative value is crucial to improve reliability. In this study, the radiation damage was evaluated by using normalized correlative coefficient (RNCC) between an initial frame and latter frames of the multiple SEM images that were taken consecutively. Tolerable dose was obtained by defining a threshold point of RNCC where rapid reduction of RNCC started. A SEM image with less damage and acceptable signal-to-noise ratio was obtained by integrating the images from the initial frame to the tolerable frame.

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Stinging apparatus of apoid wasps and bees as never seen before

ENTOMON ◽

10.33307/entomon.v45i2.516 ◽

2020 ◽

Vol 45 (2) ◽

pp. 87-92

Author(s):

Syed Najeer E Noor Khadri ◽

Rabiya Begum

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

The Other ◽

Campaniform Sensilla ◽

Lateral Aspect ◽

Hunting Behavior ◽

Sem Images ◽

Microscope Images ◽

Ampulex Compressa ◽

Scanning Electron

The stinging apparatus is expected to vary depending on the type of prey taken and the way it is carried in apoid wasps and the purpose of defense it serves in bees. To understand the differences in sting morphology, members of two apoid wasp families (Ampulicidae and Crabronidae) and a bee family (Halictidae) were studied. Scanning Electron Microscope images of lancets revealed tooth like projections on dorso-lateral aspect in Ampulex compressa (Fabricius, 1781) and blunt barbs on the lancets of Liris aurulentus (Fabricius, 1787) and Tachysphex bengalensis Cameron, 1889 whereas, in Halictus fimbriatellus Vachal, 1894 barbs are arranged in two rows on lancet, which includes four barbs on one side and three barbs on the other side of lancet which are not acutely pointed. The SEM images also indicated the presence of campaniform sensilla on the lancets of compressa. These findings help us to know the possible relationships of hunting behavior and modification of the sting in accordance.

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