Edge Detection in Scanning Electron Microscope (SEM) Images using Various Algorithms

2020 ◽  
Author(s):  
G Elizabeth Rani ◽  
R Murugeswari ◽  
N Rajini
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Edge Detection ◽  
Sem Images ◽  
Scanning Electron

Thick photoresists for electroforming metallic microcomponents

2008 ◽  
Vol 222 (1) ◽  
pp. 37-42 ◽  
Author(s):  
X Wei ◽  
C-H Lee ◽  
Z Jiang ◽  
K Jiang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Current Paper ◽  
Sem Images ◽  
Advantages And Disadvantages ◽  
Uv Lithography ◽  
Electroforming Process ◽  
Electroformed Nickel ◽  
Scanning Electron

Recently, microelectroforming has been extensively applied to fabricating metallic components for sensors, actuators, and other systems. Thick photoresists are used for making micromoulds for electroforming and closely related to the quality and costs of an electroforming process. In the current paper, thick UV photoresists SU8, BPR100, and KMPR are analysed and compared in their electroforming performance of nickel microcomponents. Optimized UV lithography processes are introduced for producing micromoulds in each of the resists and scanning electron microscope (SEM) images of the moulds are presented and analysed. Then, electroformed nickel components from the micromoulds are presented. Finally, applicability of the photoresists to electroforming microcomponents is discussed. Each of the resists demonstrates advantages and disadvantages to suit different applications.

PET Depolymerization Catalyzed by Sulfates under Microwave Irradiation

2012 ◽  
Vol 550-553 ◽  
pp. 792-797 ◽  
Author(s):  
Wei Lu Zhang ◽  
Xiao Ni Shi ◽  
Xin Zhang ◽  
Chun Hua Han ◽  
Dong Zhang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Microwave Irradiation ◽  
Polyethylene Terephthalate ◽  
Sem Images ◽  
Scanning Electron

Different sulfates were used as the catalysts of polyethylene terephthalate (PET) depolymerization under microwave of 250 watts, in which ZnSO4presented the best catalysis in this reaction, and the depolymerization degree (DPD) of PET was reached to 90 %. It was found that the depolymerization was occurred simultaneously on the surface and the internal parts of PET chips by the observation of scanning electron microscope (SEM) images. In addition, DPD increased with the improvement of the polarization forces of these sulfates.

scholarly journals QUALITY REINFORCEMENT OF ELECTROPLATING ZINC COATINGSELECTRODEPOSITED FROM CYANIDE FREE ALKALINE SOLUTION BY POLYAMINE 70.000 AND POLYVINYL ALCOHOL 16.000

2018 ◽  
Vol 55 (5B) ◽  
pp. 18
Author(s):  
Truong Thi Nam
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Polyvinyl Alcohol ◽  
Zinc Coating ◽  
Alkaline Solutions ◽  
Zinc Ions ◽  
Sem Images ◽  
Zinc Coatings ◽  
Scanning Electron ◽  
Good Agreement

Zinc coatings have been deposited electrochemically from cyanine free alkaline solutions containing zinc ions with the presence of polyamine 70.000 and polyvinyl alcohol at different contents. The scanning electron microscope (SEM) images showed that the size of zinc grains decreased with the presence of polyamine 70.000 and polyvinyl alcohol with smoother surface of zinc coating. The polarization measurements also revealed that the coatings with the presence of polyamine or polyvinyl alcohol possessed higher value of polarity degree. This result is in good agreement with the result obtained from SEM images.

Performance enhancement of Scanning Electron Microscope using a Deep Convolutional Neural Network

2022 ◽  
Author(s):  
Suresh Panchal ◽  
Unnikrishnan Gopinathan ◽  
Suwarna Datar
Keyword(s):  
Neural Network ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Convolutional Neural Network ◽  
Performance Enhancement ◽  
Deep Convolutional Neural Network ◽  
Sem Images ◽  
Scan Rate ◽  
Charging Effect ◽  
Scanning Electron

Abstract We report noise reduction and image enhancement in Scanning Electron Microscope (SEM) imaging while maintaining a Fast-Scan rate during imaging, using a Deep Convolutional Neural Network (D-CNN). SEM images of non-conducting samples without conducting coating always suffer from charging phenomenon, giving rise to SEM images with low contrast or anomalous contrast and permanent damage to the sample. One of the ways to avoid this effect is to use Fast-Scan mode, which suppresses the charging effect fairly well. Unfortunately, this also introduces noise and gives blurred images. The D-CNN has been used to predict relatively noise-free images as obtained from a Slow-Scan from a noisy, Fast-Scan image. The predicted images from D-CNN have the sharpness of images obtained from a Slow-Scan rate while reducing the charging effect due to images obtained from Fast-Scan rates. We show that using the present method, and it is possible to increase the scanning rate by a factor of about seven with an output of image quality comparable to that of the Slow-Scan mode. We present experimental results in support of the proposed method.

Single Phase Pyrite Synthesized via Hydrothermal Method

2013 ◽  
Vol 562-565 ◽  
pp. 136-140 ◽  
Author(s):  
Zhao Tang Yang ◽  
Xiao Jiang Liu ◽  
Jing Song Liu ◽  
Xiu Li Feng
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Hydrothermal Method ◽  
Single Phase ◽  
Sem Images ◽  
X Ray ◽  
Decreasing Ph ◽  
Size And Morphology ◽  
Ph Range ◽  
Scanning Electron

Single phase pyrite has been successfully prepared via the reaction of FeSO4·7H2O, S and Na2S·9H2O using hydrothermal method. The X-ray powder diffraction measurements confirm the formation of iron disulfides in the pH range of 1-12. Marcasite is formed at pH<4, the marcasite contents in the final products increasing with decreasing pH; when the pH is higher than 4, the final product is single phase pyrite. Scanning electron microscope (SEM) images reveal that both the pH and temperatures have significant effects on the size and morphology of final products. Pyrite micro-nanocubes of 200-400nm in length were synthesized at pH=9. Detailed information of the experimental results are analyzed in the results and discussion part.

Alloperla clarki sp. nov. (Plecoptera: Chloroperlidae), a new species from the eastern Nearctic with discussion of a new species group

Zootaxa ◽  
2019 ◽  
Vol 4624 (2) ◽  
pp. 241-255
Author(s):  
SCOTT A. GRUBBS ◽  
RICHARD W. BAUMANN
Keyword(s):  
Electron Microscope ◽  
New Species ◽  
Scanning Electron Microscope ◽  
Adult Male ◽  
Appalachian Mountains ◽  
Geographic Area ◽  
Species Group ◽  
Sem Images ◽  
A New Species ◽  
Scanning Electron

Alloperla Banks, 1906 (Plecoptera: Chloroperlidae) is a speciose genus of spring- and summer-emergent stoneflies known from the Oriental, eastern Palearctic, and Nearctic realms. Over 50 species are currently recognized. Alloperla clarki sp. nov. is described herein from the adult male stage from a small geographic area in the Appalachian Mountains in Virginia and West Virginia, USA. Diagnostic characters are presented with scanning electron microscope (SEM) photomicrographs. Alloperla clarki sp. nov. most closely resembles A. biserrata Nelson & Kondratieff, 1980, A. nanina Banks, 1911, and A. stipitata Surdick, 2004. These four species share similar characteristics of the male epiproct and appear to comprise a species group. The Alloperla nanina Group is formally proposed. Comparative SEM images are also provided for A. biserrata, A. nanina, and A. stipitata to assist with differentiating between these four species. 

Edge Sharpening for Unbiased Edge Detection in Field Emission Scanning Electron Microscope Images

1999 ◽  
Vol 5 (2) ◽  
pp. 136-146 ◽  
Author(s):  
P. Markondeya Raj ◽  
Stanley M. Dunn ◽  
W. Roger Cannon
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Edge Detection ◽  
Field Emission ◽  
Particle Orientation ◽  
Edge Orientation ◽  
Detection Algorithms ◽  
Scanning Direction ◽  
Scanning Electron ◽  
Edge Sharpening

We report here a specific type of edge strength anisotropy observed in field emission scanning electron microscope (FESEM) images. The images show weaker edge gradients in the scanning direction and hence these edges frequently go undetected. Direct application of edge detection algorithms to images with nondistinct edges, such as powder particles, show strong bias to edges perpendicular to the scanning direction. Edge orientation polarograms obtained from these images always show strong fictitious particle orientation in the scanning direction. In this work, we discuss an edge-sharpening algorithm that corrects for this bias and results in relatively more accurate and consistent edge orientation information.

scholarly journals A Hybrid Crack Detection Approach for Scanning Electron Microscope Image Using Deep Learning Method

Scanning ◽  
2021 ◽  
Vol 2021 ◽  
pp. 1-13
Author(s):  
Lun Zhao ◽  
Yunlong Pan ◽  
Sen Wang ◽  
Liang Zhang ◽  
Md Shafiqul Islam
Keyword(s):  
Deep Learning ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Crack Detection ◽  
Rapid Development ◽  
Detection Accuracy ◽  
Learning Method ◽  
Sem Images ◽  
Bounding Boxes ◽  
Scanning Electron

The scanning electron microscope (SEM) is widely used in the analysis and research of materials, including fracture analysis, microstructure morphology, and nanomaterial analysis. With the rapid development of materials science and computer vision technology, the level of detection technology is constantly improving. In this paper, the deep learning method is used to intelligently identify microcracks in the microscopic morphology of SEM image. A deep learning model based on image level is selected to reduce the interference of other complex microscopic topography, and a detection method with dense continuous bounding boxes suitable for SEM images is proposed. The dense and continuous bounding boxes were used to obtain the local features of the cracks and rotating the bounding boxes to reduce the feature differences between the bounding boxes. Finally, the bounding boxes with filled regression were used to highlight the microcrack detection effect. The results show that the detection accuracy of our approach reached 71.12%, and the highest mIOU reached 64.13%. Also, microcracks in different magnifications and in different backgrounds were detected successfully.

scholarly journals Определение толщины поляризованной области стекла

2021 ◽  
Vol 47 (5) ◽  
pp. 16
Author(s):  
А.И. Дергачев ◽  
В.В. Журихина ◽  
А.А. Липовский
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Energy Dispersive ◽  
Energy Dispersive Analysis ◽  
Sem Images ◽  
Dispersive Analysis ◽  
Scanning Electron ◽  
Good Agreement

It is shown that the scattering of electrons near the interface between the poled and unpoled regions of glass makes it possible to determine the thickness of the poled region from the image obtained by a scanning electron microscope. Good agreement between the thicknesses determined from the SEM images and by energy dispersive analysis was demonstrated.

scholarly journals The Effect of ZnO Addition on Microstructure, Phase and Color Developments of Copper Reduction Glaze

10.30544/99 ◽  
2015 ◽  
Vol 21 (2) ◽  
pp. 89-100
Author(s):  
N. NayebPashaee ◽  
A.M. Aarabi ◽  
H. Sarpoolaky ◽  
H. Vafaeenezhad
Keyword(s):  
Zinc Oxide ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
X Ray Diffraction ◽  
Sem Images ◽  
Electron Dispersive Spectroscopy ◽  
X Ray ◽  
Crystalline Structures ◽  
Metallic Particles ◽  
Scanning Electron

In this research, the effects of Zn on microstructure and color developments of the copper reduction glaze were investigated. Structural and colorimetric characteristics of the glaze surface are examined by X-ray diffraction, scanning electron microscope (SEM) equipped with electron dispersive spectroscopy (EDS) and Telespectrophotometery. Results indicate in samples consisted of more than 7 % of zinc amount, crystalline structures containing Willemite and synthesized copper. XRD indicate that, 14 wt% of zinc oxide is enough to form Willemite. In all samples, duration of process was sufficient to form the metallic particles. SEM images confirm presence of copper nanosphere-laths of Willemite and surrounding glaze.

Sign in / Sign up

Export Citation Format

Share Document