Using Collins Formula with Scaling Factor to Analysis the Propagation Properties in Laser Focus System Design

2016 ◽  
Vol 679 ◽  
pp. 185-190
Author(s):  
Long Shi ◽  
Yu Xing Dong ◽  
Ming Lv ◽  
Ru Hai Guo
Keyword(s):  
System Design ◽  
Optical System ◽  
Angular Spectrum ◽  
Tolerance Analysis ◽  
Scaling Factor ◽  
Optical Systems ◽  
Experimental Result ◽  
Laser Propagation ◽  
Laser Focus ◽  
Angular Spectrum Method

A Collins formula method with a scaling factor between the target-and source-plane has been proposed for the laser propagation in the optical system design, which can be used to evaluate the laser optical system performance and the tolerance analysis. The laser propagation in the optical systems can be calculated by the Collins integral formula, and an angular spectrum method has been derived by coordinate substitution. A scaling factor m is introduced to make the choice of the observation-plane more flexibility and the calculation more accurate. The laser optical system has been designed, and its tolerance analysis is conducted by the Angular-Spectrum method. The evaluating criterion is the laser spot radius in the far field, which is defined by 86.5% power in bucket (PIB). The radius of the laser spot in 90m between 0.8mm and 1.4mm with the expectation of 0.92mm is calculated by the tolerance analysis, and the experimental result is 1.01mm. In the distance of 47m, the radius is between 0.42mm and 0.73mm with the expectation of 0.48mm calculated by the tolerance analysis, the experimental result is 0.46mm. The experiment agrees the result of the tolerance analysis well. The focal shift for laser propagation in the optical systems is validated. The experiment results confirm the calculation and it proved the use of the method in laser focus optical system design.

Angular-spectrum method with scaling factor and its applications to design of laser focus optical system

2015 ◽  
Vol 23 (3) ◽  
pp. 617-625
Author(s):  
王挺峰 WANG Ting-feng ◽  
刘立生 LIU Li-sheng ◽  
郭劲 GUO Jin ◽  
陈长青 CHEN Chang-qing
Keyword(s):  
Optical System ◽  
Angular Spectrum ◽  
Scaling Factor ◽  
Spectrum Method ◽  
Laser Focus ◽  
Angular Spectrum Method

Optical System Design and Tolerance Analysis of Photoelectric Self-Collimation Theodolite

2017 ◽  
Vol 54 (10) ◽  
pp. 102203
Author(s):  
王国名 Wang Guoming ◽  
劳达宝 Lao Dabao ◽  
周维虎 Zhou Weihu
Keyword(s):  
System Design ◽  
Optical System ◽  
Tolerance Analysis ◽  
Optical System Design

Electromagnetic diffraction in optical systems - I. An integral representation of the image field

1959 ◽  
Vol 253 (1274) ◽  
pp. 349-357 ◽  
Keyword(s):  
Electromagnetic Field ◽  
Integral Representation ◽  
Optical System ◽  
Plane Waves ◽  
Angular Spectrum ◽  
Optical Systems ◽  
Angular Aperture ◽  
Spherical Waves ◽  
Simple Physical Interpretation ◽  
Electromagnetic Diffraction

An integral representation is obtained for the electromagnetic field in the image space of an optical system . This representation, which is not restricted to systems of low angular aperture, is in the form of an angular spectrum of plane waves, and is closely related to that introduced by Luneberg (1944) as a vector generalization of well-known formulae of Debye (1909) and Picht (1925). It is shown that the representation has a simple physical interpretation in terms of a modified Huygens—Fresnel principle which operates with secondary plane waves rather than with secondary spherical waves.

scholarly journals A Novel Focal Length Measurement Method for Center-Obstructed Omni-Directional Reflective Optical Systems

2019 ◽  
Vol 9 (11) ◽  
pp. 2350 ◽  
Author(s):  
Hojong Choi ◽  
Joo-Youn Jo ◽  
Jae-Myung Ryu
Keyword(s):  
Optical System ◽  
Measurement Method ◽  
Focal Length ◽  
Tolerance Analysis ◽  
Field Of View ◽  
Optical Systems ◽  
Wide Field ◽  
Surveillance Camera ◽  
Length Measurements ◽  
Design Software

An omni-directional optical system can be used as a surveillance camera owing to its wide field angle. In cases in which a system is designed with a central screen obscuring structure to increase the resolution of the off-axis field, however, the conventional methods cannot be used to measure the effective focal length (EFL). We assumed the actual and theoretical distortion values of the fabricated optical system to be the same and determined the system’s EFL by finding the minimum deviation point of the measured and theoretical distortions. The feasibility of the determined EFL was verified through a tolerance analysis of the system. For these precise measurements we also analyzed the sources of error. To verify our proposed measurement method, we measured the focal length of a center-obstructed omni-directional reflective optical system with an 80–135° field of view (FOV). The EFL from the measurement was 0.3739 mm and was only approximately 11 µm different from the EFL calculated using the design software. Thus, the reliability of focal length measurements in omni-directional optical systems was improved.

Atomic Resolution in Crystal Aperture Stem

1990 ◽  
Vol 48 (1) ◽  
pp. 236-237
Author(s):  
J T Fourie
Keyword(s):  
Optical System ◽  
Spherical Aberration ◽  
Three Dimensional ◽  
Transmission Function ◽  
Optical Systems ◽  
Bragg Angle ◽  
Electron Optical System ◽  
Intimate Contact ◽  
Diffraction Effects ◽  
Design Aspect

The attempts at improvement of electron optical systems to date, have largely been directed towards the design aspect of magnetic lenses and towards the establishment of ideal lens combinations. In the present work the emphasis has been placed on the utilization of a unique three-dimensional crystal objective aperture within a standard electron optical system with the aim to reduce the spherical aberration without introducing diffraction effects. A brief summary of this work together with a description of results obtained recently, will be given.The concept of utilizing a crystal as aperture in an electron optical system was introduced by Fourie who employed a {111} crystal foil as a collector aperture, by mounting the sample directly on top of the foil and in intimate contact with the foil. In the present work the sample was mounted on the bottom of the foil so that the crystal would function as an objective or probe forming aperture. The transmission function of such a crystal aperture depends on the thickness, t, and the orientation of the foil. The expression for calculating the transmission function was derived by Hashimoto, Howie and Whelan on the basis of the electron equivalent of the Borrmann anomalous absorption effect in crystals. In Fig. 1 the functions for a g220 diffraction vector and t = 0.53 and 1.0 μm are shown. Here n= Θ‒ΘB, where Θ is the angle between the incident ray and the (hkl) planes, and ΘB is the Bragg angle.

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