Atomic and Electronic Structures of Cu/Sapphire Interfaces by HRTEM and EELS Analyses

2005 ◽  
Vol 475-479 ◽  
pp. 3859-3862 ◽  
Author(s):  
Takeo Sasaki ◽  
Teruyasu Mizoguchi ◽  
Katsuyuki Matsunaga ◽  
Shingo Tanaka ◽  
Takahisa Yamamoto ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electronic Structures ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Deposition Technique ◽  
Transmission Electron ◽  
Electron Energy Loss

Interfacial atomic and electronic structures of Cu/Al2O3(0001) and Cu/Al2O3(11 ＿ ,20) prepared by a pulsed-laser deposition technique were characterized by high-resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS). It was found that both systems have O-terminated interfaces, irrespective of different substrate orientations. This indicates that Cu-O interactions across the interface play an important role for the Cu/Al2O3 systems.

The Local Electronic structure at Grain Boundaries and Hetero- Interfaces in ZnO Thin Films Grown by Laser Deposition.

2002 ◽  
Vol 727 ◽  
Author(s):  
Alexander Kvit ◽  
Gerd Duscher ◽  
Chunming Jin ◽  
Jagdish Narayan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electronic Structure ◽  
High Resolution ◽  
Energy Loss ◽  
Grain Boundaries ◽  
Laser Deposition ◽  
Transmission Electron ◽  
Local Electronic Structure ◽  
Electron Energy Loss

AbstractThe structure and chemistry of interfaces and grain boundaries are known to influence the optical and electrical properties of wide-band gap semiconductors structures. ZnO/AlN/Si(100) heterostructures grown by laser deposition were studied by conventional and high-resolution transmission electron microscopy (HRTEM). The local electronic structure of ZnO grain boundaries was investigated by high resolution Z-contrast imaging using scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy in a scanning mode. Zcontrast imaging and EELS were performed simultaneously enabling direct correlations between interface chemistry and local structure to be made. ZnO grain boundaries are composed of a periodic array of a basic structural unit. On the basis of the electron energy-loss near-edge structure (ELNES) of zinc and oxygen edges associated with the ZnO- grain boundaries, the corresponding electronic spectrum was discussed.

Electron Energy-Loss Spectroscopy (EELS) of Fe-Bearing Olivine and Laihunite (an Oxidized Olivine)

2000 ◽  
Vol 6 (S2) ◽  
pp. 208-209
Author(s):  
Huifang Xu ◽  
Pingqiu Fu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structure Refinement ◽  
Iron Formation ◽  
Transmission Electron ◽  
Electron Energy Loss

Laihunite that has distorted olivine-type structure with ferric and ferrous irons and ordered distribution of vacancies was first discovered in a high-grade metamorphosed banded iron formation (BIF) [1, 2]. The laihunite coexisting with fayalite (Fe-olivine), magnetite, quartz, ferrosilite, garnet and hedenbergite, formed in the process of oxidation of fayalite [2, 3]. The structure refinement of 1-layer laihunite shows P21/b symmetry and ordered distribution of vacancies in half M1 sites of olivine structure [2, 3]. Early high-resolution transmission electron microscopy (HRTEM) study and HRTEM image simulation of the 1-layer laihunite verified the structure refinement [4].Specimens of weakly oxidized fayalite and laihunite containing fayalite islands collected from Xiaolaihe and Menjiagou of Liaoning Province, NE China, have been studied using selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), and X-ray energy-dispersive spectroscopy.

Site-specific cross-sectioning of carbon nanotube-to-metal junctions for high spatial resolution chemical and structural analysis

2002 ◽  
Vol 738 ◽  
Author(s):  
K. Dovidenko ◽  
N. L. Abramson ◽  
J. Rullan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Site Specific ◽  
Transmission Electron ◽  
Electron Energy Loss

ABSTRACTIn this study, we have demonstrated successful site-specific cross-sectioning of carbon-nanotube - metal junctions which provided samples suitable for high resolution transmission electron microscopy and electron energy loss spectroscopy. For the cross-sectioning, we have suggested a modified technique based on combination of the Focused Ion Beam (FIB) lift-out and the conventional Ar+ ion milling techniques. Electron-transparent cross-sections of multiwall carbon nanotubes showing no significant surface amorphization or Ga contamination (typical artifacts of conventional FIB lift-out technique) were obtained. High-resolution transmission electron microscopy and electron energy loss spectroscopy of a multi-wall carbon nanotube cross-section have been carried out.

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