Characterization of pentavalent and hexavalent americium in nitric acid using X-ray absorption fine structure spectroscopy and first-principles modeling
2017 ◽
Vol 06
(04)
◽
Keyword(s):
X Ray
◽
2009 ◽
Vol 82
(6)
◽
pp. 698-703
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2013 ◽
Vol 299
(1)
◽
pp. 235-239
◽
Characterization of the Si/GaAs(110) interface by soft x-ray surface x-ray absorption fine structure
1995 ◽
Vol 13
(1)
◽
pp. 69
◽