Estimation of the Critical Flutter Load of a Double L-shaped Beam subjected to Follower Forces (In-Plane Vibration)

Author(s):  
I. Takahashi
1981 ◽  
Vol 4 ◽  
Author(s):  
T. J. Stultz ◽  
J. F. Gibbons

ABSTRACTStructural and electrical characterization of laser recrystallized LPCVD silicon films on amorphous substrates using a shaped cw laser beam have been performed. In comparing the results to data obtained using a circular beam, it was found that a significant increase in grain size can be achieved and that the surface morphology of the shaped beam recrystallized material was much smoother. It was also found that whereas circular beam recrystallized material has a random grain structure, shaped beam material is highly oriented with a <100> texture. Finally the electrical characteristics of the recrystallized film were very good when measured in directions parallel to the grain boundaries.


AIAA Journal ◽  
2002 ◽  
Vol 40 ◽  
pp. 1250-1252
Author(s):  
H. Qiao ◽  
Q. S. Li

Author(s):  
Jia Jie Wang ◽  
Lu Han ◽  
Yi Ping Han ◽  
Gerard Gouesbet ◽  
Xuecheng Wu ◽  
...  

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