Imaging of Ganymede through Energetic Neutral Atoms sputtered/backscattered from the surface

Author(s):  
Angèle Pontoni ◽  
Manabu Shimoyama ◽  
Shahab Fatemi ◽  
Andrew Poppe ◽  
Yoshifumi Futaana ◽  
...  

<p><span>Brightness asymmetries<!-- polar and equator --> on the surface of Ganymede are thought to be caused by ion impact from Jovian </span><span>co-rotating </span><span>plasma. The Jovian Neutrals Analyzer instrument onboard the JUICE spacecraft will help investigate this theory by yielding a map of ion precipitation at the surface of Ganymede through the observation of </span><span>low-energy </span><span>Energetic Neutral Atoms (ENAs)</span><span> (10 eV to 3300 eV)</span><span> sputtered or backscattered by </span><span>the</span><span> Jovian plasma. </span></p><p> <span><br>In order to optimize JNA operations planning at Ganymede, we </span><span>estimate</span><span> the expected energy distribution of ENAs caused by the impacting Jovian plasma. As an input, we use results from a three dimensional hybrid plasma simulation, which gives us the energy distribution of </span><span>precipitating </span><span>H+, O++ and S+++<!-- Are those spieces comfirmed? --> at the surface of Ganymede. We then calculate the ENA yield using respectively Famà’s model (Famà, 2008) for the sputtering yield of water ice and Thompson-Sigmund’s model (Sigmund, 1969) for electronic sputtering to get the energy distribution of the ENAs.</span></p>

2019 ◽  
Author(s):  
André Galli ◽  
Peter Wurz ◽  
Jens Kleimann ◽  
Horst Fichtner ◽  
Yoshifumi Futaana ◽  
...  

2020 ◽  
Author(s):  
Alexander Grigoriev ◽  
Andrei Fedorov ◽  
Nicolas André

<p>An important technique of modern space plasma diagnostics is a detection and imaging of low energy (below 10 keV) energetic neutral atoms (ENA). Any space mission devoted to study of the planetary plasma environments, planetary magnetospheres and heliosphere boundaries, needs a low energy ENA imaging sensor in its payload list. A common approach to the ENA detection/imaging is to make energetic neutral atoms glance a high quality conductive surface and either produce a secondary electron, or produce a positive or negative reflection ion. In the first case we can collect and detect the yielded secondary electron and generate a start signal. The reflected neutral atom can be directed to another surface with a high secondary electron yield. Thus we can measure a time-of-flight of the reflected particle to get its velocity. In the second case we can analyze the reflected ion in an electrostatic analyzer to get the particle energy.</p><p>Many types of conversion surfaces have been investigated over last decades in order to optimize an ENA sensor properties. We investigated properties of a thin layer of graphene applied to a silicon wafer surface. The experimental setup consisted of a secondary electron detector, neutral/ions separator and a high resolution particle imager. We used an incident He beam with energy of 200 eV - 3000 eV. We obtained a secondary electron emission, particle reflection efficiency, scattering properties, and a positive ion production rate as a function of the incident beam energy and the grazing angle. The experiment results show that 1) Graphene is a good source of secondary electrons even for low energy incident particles; 2) ENA scatter from the graphene surface similar to other surface types; 3) Graphene does not convert incident ENA to positive ions, especially for high grazing angles.</p>


Icarus ◽  
2016 ◽  
Vol 269 ◽  
pp. 91-97 ◽  
Author(s):  
Martin Wieser ◽  
Yoshifumi Futaana ◽  
Stas Barabash ◽  
Peter Wurz

1983 ◽  
Vol T6 ◽  
pp. 104-105 ◽  
Author(s):  
J Möller ◽  
M Neumann ◽  
W Heiland

1993 ◽  
Vol 317 ◽  
Author(s):  
N.A. Marks ◽  
P. Guan ◽  
D.R. Mckenzie ◽  
B.A. PailThorpe

ABSTRACTMolecular dynamics simulations of nickel and carbon have been used to study the phenomena due to ion impact. The nickel and carbon interactions were described using the Lennard-Jones and Stillinger-Weber potentials respectively. The phenomena occurring after the impact of 100 e V to 1 keV ions were studied in the nickel simulations, which were both two and three-dimensional. Supersonic focussed collision sequences (or focusons) were observed, and associated with these focusons were unexpected sonic bow waves, which were a major energy loss mechanism for the focuson. A number of 2D carbon films were grown and the stress in the films as a function of incident ion energy was Measured. With increasing energy the stress changed from tensile to compressive and reached a maximum around 50 eV, in agreement with experiment.


1998 ◽  
Vol 46 (9-10) ◽  
pp. 1349-1362 ◽  
Author(s):  
B.H. Mauk ◽  
S.M. Krimigis ◽  
D.G. Mitchell ◽  
E.C. Roelof ◽  
E.P. Keath ◽  
...  

2012 ◽  
Author(s):  
Jacob Heerikhuisen ◽  
Nikolai Pogorelov ◽  
Gary Zank

Sign in / Sign up

Export Citation Format

Share Document