Application of AHP to Multi-Item Inventory Management Using Part Period Algorithm

This empirical study deals with integration of Analytical Hierarchy Process (AHP) with multi-item inventory management using Part-Period Algorithm. Among many variables which affects inventory systems, this study considers the variables of lot-sizing rules, sequencing, demand pattern, coefficient of variations, and change over cost. AHP is used to pick a sequencing rule and performance criteria. This study describes the application of AHP methodology in the form of multiple tables that will assist production managers in a Group Technology environment, to minimize employee and machine idleness. It will help managers make decisions on production order quantity, the sequence in which jobs should enter work centers, and in the determination of uniform production cycle times.

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Multisource evaluation validity: Multiple executive levels and performance criteria

PsycEXTRA Dataset ◽

10.1037/e518712013-195 ◽

2003 ◽

Author(s):

Gary M. Allen ◽

Erin Ross

Keyword(s):

Performance Criteria ◽

And Performance

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Enhancements of Non-contact Measurements of Electrical Waveforms on the Proximity of a Signal Surface Using Groups of Pulses

ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2002p0483 ◽

2002 ◽

Author(s):

Fenglei Du ◽

Greg Bridges ◽

D.J. Thomson ◽

Rama R. Goruganthu ◽

Shawn McBride ◽

...

Keyword(s):

Integrated Circuits ◽

Integrated Circuit ◽

Signal To Noise Ratio ◽

Electrostatic Force ◽

Single Pulse ◽

Electric Signal ◽

Measurement Instruments ◽

Cycle Times ◽

Force Microscopy ◽

And Performance

Abstract With the ever-increasing density and performance of integrated circuits, non-invasive, accurate, and high spatial and temporal resolution electric signal measurement instruments hold the key to performing successful diagnostics and failure analysis. Sampled electrostatic force microscopy (EFM) has the potential for such applications. It provides a noninvasive approach to measuring high frequency internal integrated circuit signals. Previous EFMs operate using a repetitive single-pulse sampling approach and are inherently subject to the signal-to-noise ratio (SNR) problems when test pattern duty cycle times become large. In this paper we present an innovative technique that uses groups of pulses to improve the SNR of sampled EFM systems. The approach can easily provide more than an order-ofmagnitude improvement to the SNR. The details of the approach are presented.

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