Erratum to :  Novel Approaches to Molecular Recognition of Ionic and Neutral Species by Using Membranes

AbstractThe dual laser-produced plasma technique for the study of ionic absorption spectra has been developed by the use of two Q-switched ruby lasers to enable independent generation of the absorbing and back-lighting plasmas. Optical pulse handling is used in the coupling cicuits to enable reproducible pulse delays from 250 nsec. to 10 msec, to be achieved. At delay times > 700 nsec. spectra of essentially pure neutral species are observed. The technique is valuable, not only for obtaining the neutral spectra of highly refractory and/or corrosive materials but also for studying behaviour of ionic species as a function of time. Typical spectra are shown in Fig. 1.

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Radiation-induced surface decomposition

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075592 ◽

1983 ◽

Vol 41 ◽

pp. 368-369

Author(s):

M. L. Knotek

Keyword(s):

Ionizing Radiation ◽

Atomic Structure ◽

Chemical Bonding ◽

Neutral Species ◽

Radiation Induced ◽

Physical And Chemical ◽

Surface Decomposition ◽

The Relationship ◽

Electron And Photon ◽

Surface Bond

Modern surface analysis is based largely upon the use of ionizing radiation to probe the electronic and atomic structure of the surfaces physical and chemical makeup. In many of these studies the ionizing radiation used as the primary probe is found to induce changes in the structure and makeup of the surface, especially when electrons are employed. A number of techniques employ the phenomenon of radiation induced desorption as a means of probing the nature of the surface bond. These include Electron- and Photon-Stimulated Desorption (ESD and PSD) which measure desorbed ionic and neutral species as they leave the surface after the surface has been excited by some incident ionizing particle. There has recently been a great deal of activity in determining the relationship between the nature of chemical bonding and its susceptibility to radiation damage.

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Novel Approaches to Low-Voltage Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180586 ◽

1990 ◽

Vol 48 (1) ◽

pp. 366-367

Author(s):

Arthur V. Jones

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Electron Optics ◽

Current Interest ◽

New Concepts ◽

Opportune Time ◽

Novel Approaches ◽

Voltage Scanning ◽

Scanning Electron

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

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