A Near-Duplicate Image Detection System for Design Contents Using SIFT

2019 ◽  
Vol 25 (5) ◽  
pp. 257-262
Author(s):  
Seungbin Lee ◽  
Jongho Nang
Author(s):  
S. W. Kwon ◽  
I. S. Song ◽  
S. W. Lee ◽  
J. S. Lee ◽  
J. H. Kim ◽  
...  

2009 ◽  
Vol 69 (5) ◽  
pp. AB189 ◽  
Author(s):  
Jean-Christophe Saurin ◽  
Emmanuel Ben Soussan ◽  
Marianne Gaudric ◽  
Marie-George Lapalus ◽  
Franck Cholet ◽  
...  

Sensors ◽  
2018 ◽  
Vol 18 (7) ◽  
pp. 2327 ◽  
Author(s):  
Jinsong Zhang ◽  
Wenjie Xing ◽  
Mengdao Xing ◽  
Guangcai Sun

In recent years, terahertz imaging systems and techniques have been developed and have gradually become a leading frontier field. With the advantages of low radiation and clothing-penetrable, terahertz imaging technology has been widely used for the detection of concealed weapons or other contraband carried on personnel at airports and other secure locations. This paper aims to detect these concealed items with deep learning method for its well detection performance and real-time detection speed. Based on the analysis of the characteristics of terahertz images, an effective detection system is proposed in this paper. First, a lots of terahertz images are collected and labeled as the standard data format. Secondly, this paper establishes the terahertz classification dataset and proposes a classification method based on transfer learning. Then considering the special distribution of terahertz image, an improved faster region-based convolutional neural network (Faster R-CNN) method based on threshold segmentation is proposed for detecting human body and other objects independently. Finally, experimental results demonstrate the effectiveness and efficiency of the proposed method for terahertz image detection.


2020 ◽  
Vol 10 (7) ◽  
pp. 2511
Author(s):  
Young-Joo Han ◽  
Ha-Jin Yu

As defect detection using machine vision is diversifying and expanding, approaches using deep learning are increasing. Recently, there have been much research for detecting and classifying defects using image segmentation, image detection, and image classification. These methods are effective but require a large number of actual defect data. However, it is very difficult to get a large amount of actual defect data in industrial areas. To overcome this problem, we propose a method for defect detection using stacked convolutional autoencoders. The autoencoders we proposed are trained by using only non-defect data and synthetic defect data generated by using the characteristics of defect based on the knowledge of the experts. A key advantage of our approach is that actual defect data is not required, and we verified that the performance is comparable to the systems trained using real defect data.


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